EBSD analysis of electroplated magnetite thin films

A. Koblischka-Veneva, M. R. Koblischka, C. L. Teng, M. P. Ryan, U. Hartmann, F. Mücklich

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

By means of electron backscatter diffraction (EBSD), we analyse the crystallographic orientation of electroplated magnetite thin films on Si/copper substrates. Varying the voltage during the electroplating procedure, the resulting surface properties are differing considerably. While a high voltage produces larger but individual grains on the surface, the surfaces become smoother on decreasing voltage. Good quality Kikuchi patterns could be obtained from all samples; even on individual grains, where the surface and the edges could be measured. The spatial resolution of the EBSD measurement could be increased to about 10 nm; thus enabling a detailed analysis of single magnetite grains. The thin film samples are polycrystalline and do not exhibit a preferred orientation. EBSD reveals that the grain size changes depending on the processing conditions, while the detected misorientation angles stay similar.

Original languageEnglish
Pages (from-to)1235-1238
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
Volume322
Issue number9-12
DOIs
Publication statusPublished - 2010 May 1

Keywords

  • EBSD
  • Grain orientation
  • Magnetite

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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