EBSD analysis of the growth of (0 0 1) magnetite thin films on MgO substrates

Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, S. Murphy, S. K. Arora, U. Hartmann, F. Mücklich, I. V. Shvets

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Magnetite (Fe3O4) thin films grown on (0 0 1) MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high-spatial resolution up to 20 nm even on ceramic samples. The magnetite films are fully strained due to the lattice mismatch of MgO and Fe3O4. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that most of the misorientation boundaries existing in the as-grown films are vanishing after the annealing step and the remaining misoriented grains form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.

Original languageEnglish
Pages (from-to)64-68
Number of pages5
JournalMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume144
Issue number1-3
DOIs
Publication statusPublished - 2007 Nov 25
Externally publishedYes

Fingerprint

Ferrosoferric Oxide
Magnetite
Electron diffraction
magnetite
Thin films
Substrates
thin films
diffraction
Annealing
Magnetic force microscopy
Magnetic domains
Lattice mismatch
annealing
electrons
magnetic force microscopy
magnetic domains
misalignment
Magnetic properties
spatial resolution
ceramics

Keywords

  • Electron backscatter diffraction
  • Magnetite
  • Microstructure
  • Texture

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

EBSD analysis of the growth of (0 0 1) magnetite thin films on MgO substrates. / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Murphy, S.; Arora, S. K.; Hartmann, U.; Mücklich, F.; Shvets, I. V.

In: Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Vol. 144, No. 1-3, 25.11.2007, p. 64-68.

Research output: Contribution to journalArticle

@article{76d93cb84f8d4015b6f102307dfa3d5a,
title = "EBSD analysis of the growth of (0 0 1) magnetite thin films on MgO substrates",
abstract = "Magnetite (Fe3O4) thin films grown on (0 0 1) MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high-spatial resolution up to 20 nm even on ceramic samples. The magnetite films are fully strained due to the lattice mismatch of MgO and Fe3O4. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that most of the misorientation boundaries existing in the as-grown films are vanishing after the annealing step and the remaining misoriented grains form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.",
keywords = "Electron backscatter diffraction, Magnetite, Microstructure, Texture",
author = "Koblischka-Veneva, {Anjela Dimitrova} and Koblischka, {Michael Rudolf} and S. Murphy and Arora, {S. K.} and U. Hartmann and F. M{\"u}cklich and Shvets, {I. V.}",
year = "2007",
month = "11",
day = "25",
doi = "10.1016/j.mseb.2007.07.054",
language = "English",
volume = "144",
pages = "64--68",
journal = "Materials Science and Engineering B: Solid-State Materials for Advanced Technology",
issn = "0921-5107",
publisher = "Elsevier BV",
number = "1-3",

}

TY - JOUR

T1 - EBSD analysis of the growth of (0 0 1) magnetite thin films on MgO substrates

AU - Koblischka-Veneva, Anjela Dimitrova

AU - Koblischka, Michael Rudolf

AU - Murphy, S.

AU - Arora, S. K.

AU - Hartmann, U.

AU - Mücklich, F.

AU - Shvets, I. V.

PY - 2007/11/25

Y1 - 2007/11/25

N2 - Magnetite (Fe3O4) thin films grown on (0 0 1) MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high-spatial resolution up to 20 nm even on ceramic samples. The magnetite films are fully strained due to the lattice mismatch of MgO and Fe3O4. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that most of the misorientation boundaries existing in the as-grown films are vanishing after the annealing step and the remaining misoriented grains form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.

AB - Magnetite (Fe3O4) thin films grown on (0 0 1) MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high-spatial resolution up to 20 nm even on ceramic samples. The magnetite films are fully strained due to the lattice mismatch of MgO and Fe3O4. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that most of the misorientation boundaries existing in the as-grown films are vanishing after the annealing step and the remaining misoriented grains form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.

KW - Electron backscatter diffraction

KW - Magnetite

KW - Microstructure

KW - Texture

UR - http://www.scopus.com/inward/record.url?scp=35748956703&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=35748956703&partnerID=8YFLogxK

U2 - 10.1016/j.mseb.2007.07.054

DO - 10.1016/j.mseb.2007.07.054

M3 - Article

AN - SCOPUS:35748956703

VL - 144

SP - 64

EP - 68

JO - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

JF - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

SN - 0921-5107

IS - 1-3

ER -