EBSD-characterization of specific microstructures in RE-BCO superconductors

Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, Jorg Schmauch, Y. Wan, J. Qian, Xin Yao

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Using the electron backscatter diffraction (EBSD) technique, we analyze in this contribution the microstructure of YBa2Cu3Ox (YBCO) thick films with embedded a-axis oriented grains. The YBCO films were prepared by LPE in air using NdGaO3 substrates. Using this technique, a/c-grain boundaries (GBs) with a well-defined facet of the YBCO film characterized by a single-crystalline nature is obtained. This type of GB is very important for the basic physics of GBs in high-Tc superconductor materials, and will contribute to a better understanding of GBs also in bulk materials. The application of EBSD to the analysis of a/c-GBs in YBCO requires a high Kikuchi pattern quality (IQ) to enable a proper distinction of the orientation, as the a-axis corresponds to about 1/3 of the c-axis which can cause a misinterpretation of the resulting data. Having solved this problem, the EBSD-based determination of the GB misorientation angles directly proof the specific grain orientation achieved in the film growth.

Original languageEnglish
JournalIEEE Transactions on Applied Superconductivity
DOIs
Publication statusAccepted/In press - 2018 Jan 1

Fingerprint

Electron diffraction
Superconducting materials
Grain boundaries
grain boundaries
microstructure
Microstructure
diffraction
electrons
Film growth
Thick films
misalignment
Crystal orientation
thick films
flat surfaces
Physics
Crystalline materials
physics
causes
air
Substrates

Keywords

  • a-axis oriented grains
  • Crystals
  • Diffraction
  • Electron backscatter diffraction (EBSD)
  • Films
  • Image color analysis
  • micro-structure
  • Software
  • Superconducting magnets
  • thick films
  • YBCO
  • Yttrium barium copper oxide

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

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abstract = "Using the electron backscatter diffraction (EBSD) technique, we analyze in this contribution the microstructure of YBa2Cu3Ox (YBCO) thick films with embedded a-axis oriented grains. The YBCO films were prepared by LPE in air using NdGaO3 substrates. Using this technique, a/c-grain boundaries (GBs) with a well-defined facet of the YBCO film characterized by a single-crystalline nature is obtained. This type of GB is very important for the basic physics of GBs in high-Tc superconductor materials, and will contribute to a better understanding of GBs also in bulk materials. The application of EBSD to the analysis of a/c-GBs in YBCO requires a high Kikuchi pattern quality (IQ) to enable a proper distinction of the orientation, as the a-axis corresponds to about 1/3 of the c-axis which can cause a misinterpretation of the resulting data. Having solved this problem, the EBSD-based determination of the GB misorientation angles directly proof the specific grain orientation achieved in the film growth.",
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AU - Koblischka-Veneva, Anjela Dimitrova

AU - Koblischka, Michael Rudolf

AU - Schmauch, Jorg

AU - Wan, Y.

AU - Qian, J.

AU - Yao, Xin

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