EBSD Characterization of Specific Microstructures in RE-BCO Superconductors

Anjela Koblischka-Veneva, Michael R. Koblischka, Jorg Schmauch, Y. Wan, J. Qian, Xin Yao

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Using the electron backscatter diffraction (EBSD) technique, we analyze in this contribution the microstructure of YBa2Cu3Ox (YBCO) thick films with embedded a-axis oriented grains. The YBCO films were prepared by liquid phase epitaxy in air using NdGaO3 substrates. Using this technique, a/c-grain boundaries (GBs) with a well-defined facet of the YBCO film characterized by a single crystalline nature are obtained. This type of GB is very important for the basic physics of GBs in high-Tc superconductor materials, and will contribute to a better understanding of GBs also in bulk materials. The application of EBSD to the analysis of a/c-GBs in YBCO requires a high Kikuchi pattern quality (i.e., image quality) to enable a proper distinction of the orientation, as the a-axis corresponds to about one-third of the c-axis, which can cause a misinterpretation of the resulting data. Having solved this problem, the EBSD-based determination of the GB misorientation angles directly proof the specific grain orientation achieved in the film growth.

Original languageEnglish
Article number8528876
JournalIEEE Transactions on Applied Superconductivity
Volume29
Issue number3
DOIs
Publication statusPublished - 2019 Apr

Keywords

  • YBa2Cu3Ox (YBCO)
  • a-axis-oriented grains
  • electron backscatter diffraction (EBSD)
  • microstructure
  • thick films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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