TY - JOUR
T1 - EBSD Characterization of Specific Microstructures in RE-BCO Superconductors
AU - Koblischka-Veneva, Anjela
AU - Koblischka, Michael R.
AU - Schmauch, Jorg
AU - Wan, Y.
AU - Qian, J.
AU - Yao, Xin
N1 - Funding Information:
Manuscript received January 19, 2018; revised June 17, 2018; accepted October 6, 2018. Date of publication November 9, 2018; date of current version January 8, 2019. This work was supported by the German Research Foundation through Project Ko2323/10. This paper was recommended by Associate Editor H. Fujishiro. (Corresponding author: Michael R. Koblischka.) A. Koblischka-Veneva and M. R. Koblischka are with the Department of Experimental Physics, Saarland University, 66041 Saarbrücken, Germany, and also with the Department of Materials Science and Engineering, Shibaura Institute of Technology, Tokyo 135-8548, Japan (e-mail:, m.koblischka@ mx.uni-saarland.de).
Publisher Copyright:
© 2002-2011 IEEE.
PY - 2019/4
Y1 - 2019/4
N2 - Using the electron backscatter diffraction (EBSD) technique, we analyze in this contribution the microstructure of YBa2Cu3Ox (YBCO) thick films with embedded a-axis oriented grains. The YBCO films were prepared by liquid phase epitaxy in air using NdGaO3 substrates. Using this technique, a/c-grain boundaries (GBs) with a well-defined facet of the YBCO film characterized by a single crystalline nature are obtained. This type of GB is very important for the basic physics of GBs in high-Tc superconductor materials, and will contribute to a better understanding of GBs also in bulk materials. The application of EBSD to the analysis of a/c-GBs in YBCO requires a high Kikuchi pattern quality (i.e., image quality) to enable a proper distinction of the orientation, as the a-axis corresponds to about one-third of the c-axis, which can cause a misinterpretation of the resulting data. Having solved this problem, the EBSD-based determination of the GB misorientation angles directly proof the specific grain orientation achieved in the film growth.
AB - Using the electron backscatter diffraction (EBSD) technique, we analyze in this contribution the microstructure of YBa2Cu3Ox (YBCO) thick films with embedded a-axis oriented grains. The YBCO films were prepared by liquid phase epitaxy in air using NdGaO3 substrates. Using this technique, a/c-grain boundaries (GBs) with a well-defined facet of the YBCO film characterized by a single crystalline nature are obtained. This type of GB is very important for the basic physics of GBs in high-Tc superconductor materials, and will contribute to a better understanding of GBs also in bulk materials. The application of EBSD to the analysis of a/c-GBs in YBCO requires a high Kikuchi pattern quality (i.e., image quality) to enable a proper distinction of the orientation, as the a-axis corresponds to about one-third of the c-axis, which can cause a misinterpretation of the resulting data. Having solved this problem, the EBSD-based determination of the GB misorientation angles directly proof the specific grain orientation achieved in the film growth.
KW - YBa2Cu3Ox (YBCO)
KW - a-axis-oriented grains
KW - electron backscatter diffraction (EBSD)
KW - microstructure
KW - thick films
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U2 - 10.1109/TASC.2018.2880173
DO - 10.1109/TASC.2018.2880173
M3 - Article
AN - SCOPUS:85056356237
SN - 1051-8223
VL - 29
JO - IEEE Transactions on Applied Superconductivity
JF - IEEE Transactions on Applied Superconductivity
IS - 3
M1 - 8528876
ER -