EBSD-characterization of specific microstructures in RE-BCO superconductors

Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, Jorg Schmauch, Y. Wan, J. Qian, Xin Yao

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Using the electron backscatter diffraction (EBSD) technique, we analyze in this contribution the microstructure of YBa2Cu3Ox (YBCO) thick films with embedded a-axis oriented grains. The YBCO films were prepared by LPE in air using NdGaO3 substrates. Using this technique, a/c-grain boundaries (GBs) with a well-defined facet of the YBCO film characterized by a single-crystalline nature is obtained. This type of GB is very important for the basic physics of GBs in high-Tc superconductor materials, and will contribute to a better understanding of GBs also in bulk materials. The application of EBSD to the analysis of a/c-GBs in YBCO requires a high Kikuchi pattern quality (IQ) to enable a proper distinction of the orientation, as the a-axis corresponds to about 1/3 of the c-axis which can cause a misinterpretation of the resulting data. Having solved this problem, the EBSD-based determination of the GB misorientation angles directly proof the specific grain orientation achieved in the film growth.

Original languageEnglish
JournalIEEE Transactions on Applied Superconductivity
DOIs
Publication statusAccepted/In press - 2018 Jan 1

Keywords

  • a-axis oriented grains
  • Crystals
  • Diffraction
  • Electron backscatter diffraction (EBSD)
  • Films
  • Image color analysis
  • micro-structure
  • Software
  • Superconducting magnets
  • thick films
  • YBCO
  • Yttrium barium copper oxide

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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