Effect of Fatigue Crack Network in Die-attach Joints on Thermal Resistance

Koki Ochi, Yoshinori Yokoyama, Ryuichiro Hanada, Shinichi Izuo, Kazuyasu Nishikawa, Hiroki Kanai, Yoshiki Abe, Yoshiharu Kariya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We evaluated the effect of fatigue crack networks in die-attach joints on the thermal resistance Rt and found singular rise of Rt in the final phase of fatigue crack networks formation. Structure of samples was Si/Solder/Si joints, and Sn-based lead-free solder alloys were used for the die-attach materials. We conducted thermal cycling tests and measured Rt, vertical crack density and thickness of die-attach joints before/after the tests. Then, we calculated rise of Rt due to vertical cracks and found that increase of measured Rt became twice larger than calculated one in the final phase of fatigue crack networks formation.

Original languageEnglish
Title of host publicationPCIM Asia 2022 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Proceedings
PublisherVDE Verlag GmbH
Pages116-120
Number of pages5
ISBN (Electronic)9783800759125
Publication statusPublished - 2022
Event2022 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Asia 2022 - Shanghai, China
Duration: 2022 Oct 262022 Oct 27

Publication series

NamePCIM Asia 2022 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Proceedings

Conference

Conference2022 International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, PCIM Asia 2022
Country/TerritoryChina
CityShanghai
Period22/10/2622/10/27

ASJC Scopus subject areas

  • Artificial Intelligence
  • Hardware and Architecture
  • Energy Engineering and Power Technology
  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering

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