Effect of the chemical inhomogeneity on the vortex lattice observed by the Bitter decoration technique in high-Tc superconductors

T. Muraoka, N. Chikumoto, T. Machi, I. Hirabayashi, Masato Murakami

Research output: Contribution to journalArticle

Abstract

We have performed local magnetization measurements on Bi 2SrCa2Cu2O8+y (Bi2212) single crystals grown by TSFZ method using Bitter decoration technique and MO imaging technique, which provides information of static vortex structures at the surface of superconductors. MO image revealed the presence of micron-scale inhomogeneities of critical currents, which is ascribed to the chemical fluctuation as analyzed by WDS. We could successfully observe nanometer-scale line defects with Bitter decoration technique performed at 65 K. The observed structure was largely disordered, presumably due to thermally activated motion during the decoration.

Original languageEnglish
Pages (from-to)88-93
Number of pages6
JournalPhysica C: Superconductivity and its Applications
Volume426-431
Issue numberI
DOIs
Publication statusPublished - 2005 Oct 1

Fingerprint

Superconducting materials
inhomogeneity
Vortex flow
vortices
Wavelength dispersive spectroscopy
imaging techniques
critical current
Critical currents
magnetization
Magnetization
single crystals
defects
Single crystals
Imaging techniques
Defects

Keywords

  • Bi2212
  • Bitter decoration
  • Chemical inhomogeneity
  • Magneto-optical imaging

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Effect of the chemical inhomogeneity on the vortex lattice observed by the Bitter decoration technique in high-Tc superconductors. / Muraoka, T.; Chikumoto, N.; Machi, T.; Hirabayashi, I.; Murakami, Masato.

In: Physica C: Superconductivity and its Applications, Vol. 426-431, No. I, 01.10.2005, p. 88-93.

Research output: Contribution to journalArticle

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AU - Murakami, Masato

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