Effects of buffer leakage current on breakdown voltage in AlGaN/GaN HEMTs with a high-k passivation layer

Yoshiki Satoh; Hideyuki Hanawa; Kazushige Horio

doi:10.1109/EuMIC.2016.7777560

Effects of buffer leakage current on breakdown voltage in AlGaN/GaN HEMTs with a high-k passivation layer

Yoshiki Satoh, Hideyuki Hanawa, Kazushige Horio

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A two-dimensional analysis of off-state breakdown characteristics in AlGaN/GaN HEMTs is performed by considering a deep donor and a deep acceptor in a buffer layer, with the relative permittivity of passivation layer ϵ_r as a parameter. The analysis is made with and without impact ionization of carriers to study how the buffer leakage current affects the breakdown performance. It is shown that when ϵ_r is low, the breakdown voltage is determined by the impact ionization of carriers, and when ϵ_r becomes high, it is determined by the buffer leakage current. This buffer leakage current decreases as ϵ_r increases because the electric field at the drain edge of the gate is weakened, and hence the breakdown voltage increases as ϵ_r increases. It is also shown that when the gate voltage is more negative, the breakdown voltage in the high ϵ_r region becomes higher because the buffer leakage current becomes smaller.

Original language	English
Title of host publication	EuMIC 2016 - 11th European Microwave Integrated Circuits Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	341-344
Number of pages	4
ISBN (Electronic)	9782874870446
DOIs	https://doi.org/10.1109/EuMIC.2016.7777560
Publication status	Published - 2016 Dec 7
Event	11th European Microwave Integrated Circuits Conference, EuMIC 2016 - London, United Kingdom Duration: 2016 Oct 3 → 2016 Oct 4

Other

Other	11th European Microwave Integrated Circuits Conference, EuMIC 2016
Country	United Kingdom
City	London
Period	16/10/3 → 16/10/4

Keywords

breakdown voltage
buffer leakage current
GaN
HEMT
high-k passivation layer
impact ionization of carriers

ASJC Scopus subject areas

Electrical and Electronic Engineering
Instrumentation

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Satoh, Y., Hanawa, H., & Horio, K. (2016). Effects of buffer leakage current on breakdown voltage in AlGaN/GaN HEMTs with a high-k passivation layer. In EuMIC 2016 - 11th European Microwave Integrated Circuits Conference (pp. 341-344). [7777560] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EuMIC.2016.7777560

Effects of buffer leakage current on breakdown voltage in AlGaN/GaN HEMTs with a high-k passivation layer. / Satoh, Yoshiki; Hanawa, Hideyuki; Horio, Kazushige.

EuMIC 2016 - 11th European Microwave Integrated Circuits Conference. Institute of Electrical and Electronics Engineers Inc., 2016. p. 341-344 7777560.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Satoh, Y, Hanawa, H & Horio, K 2016, Effects of buffer leakage current on breakdown voltage in AlGaN/GaN HEMTs with a high-k passivation layer. in EuMIC 2016 - 11th European Microwave Integrated Circuits Conference., 7777560, Institute of Electrical and Electronics Engineers Inc., pp. 341-344, 11th European Microwave Integrated Circuits Conference, EuMIC 2016, London, United Kingdom, 16/10/3. https://doi.org/10.1109/EuMIC.2016.7777560

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abstract = "A two-dimensional analysis of off-state breakdown characteristics in AlGaN/GaN HEMTs is performed by considering a deep donor and a deep acceptor in a buffer layer, with the relative permittivity of passivation layer ϵr as a parameter. The analysis is made with and without impact ionization of carriers to study how the buffer leakage current affects the breakdown performance. It is shown that when ϵr is low, the breakdown voltage is determined by the impact ionization of carriers, and when ϵr becomes high, it is determined by the buffer leakage current. This buffer leakage current decreases as ϵr increases because the electric field at the drain edge of the gate is weakened, and hence the breakdown voltage increases as ϵr increases. It is also shown that when the gate voltage is more negative, the breakdown voltage in the high ϵr region becomes higher because the buffer leakage current becomes smaller.",

keywords = "breakdown voltage, buffer leakage current, GaN, HEMT, high-k passivation layer, impact ionization of carriers",

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KW - impact ionization of carriers

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