Effects of buffer traps on breakdown characteristics in field-plate AlGaN/GaN HEMTs

H. Onodera, A. Nakajima, K. Horio

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)71-72
JournalProceedings of the 5th Asia-Pacific Workshop on Widegap Semiconductors (APWS 2011), Toba, Japan
Publication statusPublished - 2011 May 23

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