Effects of decreasing extent of electromagnetic field at LSI mounting area on radiated emission from PCB

Satoru Haga, Ken Nakano, Toshio Sudo

Research output: Contribution to conferencePaper

3 Citations (Scopus)

Abstract

Radiating mechanism and reduction measures have been studied using test LSI and PCB. Among LSI operation modes, I/O buffer operation radiates the greatest amount of emission and shows that LSI mounting area behaves an opening from the electromagnetic viewpoint. The measure, decreasing extent of electromagnetic field at LSI mounting area, have been verified effective.

Original languageEnglish
Pages25-28
Number of pages4
Publication statusPublished - 2001 Dec 1
EventIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, United States
Duration: 2001 Oct 292001 Oct 31

Conference

ConferenceIEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging
CountryUnited States
CityCambridge, MA
Period01/10/2901/10/31

ASJC Scopus subject areas

  • Engineering(all)

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    Haga, S., Nakano, K., & Sudo, T. (2001). Effects of decreasing extent of electromagnetic field at LSI mounting area on radiated emission from PCB. 25-28. Paper presented at IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging, Cambridge, MA, United States.