Effects of field plate on buffer-related lag phenomena and current collapse in GaN MESFETs and HEMTs

K. Itagaki, A. Nakajima, K. Horio

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)107-108
JournalProceedings of the 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2008), Leuven, Belgium
Publication statusPublished - 2008 May 20

Cite this

@article{5cb13f87b01342bf8b22c58cccb10736,
title = "Effects of field plate on buffer-related lag phenomena and current collapse in GaN MESFETs and HEMTs",
author = "K. Itagaki and A. Nakajima and K. Horio",
year = "2008",
month = "5",
day = "20",
language = "English",
pages = "107--108",
journal = "Proceedings of the 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2008), Leuven, Belgium",

}

TY - JOUR

T1 - Effects of field plate on buffer-related lag phenomena and current collapse in GaN MESFETs and HEMTs

AU - Itagaki, K.

AU - Nakajima, A.

AU - Horio, K.

PY - 2008/5/20

Y1 - 2008/5/20

M3 - Article

SP - 107

EP - 108

JO - Proceedings of the 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2008), Leuven, Belgium

JF - Proceedings of the 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2008), Leuven, Belgium

ER -