Effects of Impact Ionization on - Characteristics of GaAs n-i-n Structures Including Hole Trap

K. Horio, H. Kusuki

Research output: Contribution to journalArticle

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)541-543
JournalIEEE Electron Device Letters
Volume13
Publication statusPublished - 1992 Oct 1

Cite this

Effects of Impact Ionization on - Characteristics of GaAs n-i-n Structures Including Hole Trap. / Horio, K.; Kusuki, H.

In: IEEE Electron Device Letters, Vol. 13, 01.10.1992, p. 541-543.

Research output: Contribution to journalArticle

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AU - Kusuki, H.

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