Effects of impact-ionized carrier trapping by surface states on gate-lag and kink phenomena in GaAs MESFETs

A. Wakabayashi, Y. Mitani, K. Horio

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)327-330
JournalProceedings of ISSSE'01, Tokyo, Japan
Publication statusPublished - 2001 Jul 1

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