Abstract
Simultaneous switching noise and electromagnetic radiation in electronic systems are becoming serious problems with the increase in operating speed of digital circuits. Recently, it was recognized that LSI chips are primary sources of electromagnetic radiation. This paper presents experimental results using two types of test chips, one with and one without an on-chip decoupling capacitor. The effects of the on-chip decoupling capacitor on radiated emission and simultaneous switching noise were characterized by activating I/O circuits or core logic circuits. More than 5 dB of electromagnetic radiation were reduced with the implementation of the on-chip decoupling capacitor for core logic operation.
| Original language | English |
|---|---|
| Pages (from-to) | 6380-6383 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 42 |
| Issue number | 10 |
| Publication status | Published - 2003 Oct |
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Keywords
- Electromagnetic radiation
- On-chip decoupling capacitor
- Simultaneous switching noise
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
Cite this
Effects of On-Chip Decoupling Capacitor on Switching Noise and Radiated Emission. / Sudo, Toshio; Nakano, Ken; Kudo, Junichi; Haga, Satoru.
In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 42, No. 10, 10.2003, p. 6380-6383.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Effects of On-Chip Decoupling Capacitor on Switching Noise and Radiated Emission
AU - Sudo, Toshio
AU - Nakano, Ken
AU - Kudo, Junichi
AU - Haga, Satoru
PY - 2003/10
Y1 - 2003/10
N2 - Simultaneous switching noise and electromagnetic radiation in electronic systems are becoming serious problems with the increase in operating speed of digital circuits. Recently, it was recognized that LSI chips are primary sources of electromagnetic radiation. This paper presents experimental results using two types of test chips, one with and one without an on-chip decoupling capacitor. The effects of the on-chip decoupling capacitor on radiated emission and simultaneous switching noise were characterized by activating I/O circuits or core logic circuits. More than 5 dB of electromagnetic radiation were reduced with the implementation of the on-chip decoupling capacitor for core logic operation.
AB - Simultaneous switching noise and electromagnetic radiation in electronic systems are becoming serious problems with the increase in operating speed of digital circuits. Recently, it was recognized that LSI chips are primary sources of electromagnetic radiation. This paper presents experimental results using two types of test chips, one with and one without an on-chip decoupling capacitor. The effects of the on-chip decoupling capacitor on radiated emission and simultaneous switching noise were characterized by activating I/O circuits or core logic circuits. More than 5 dB of electromagnetic radiation were reduced with the implementation of the on-chip decoupling capacitor for core logic operation.
KW - Electromagnetic radiation
KW - On-chip decoupling capacitor
KW - Simultaneous switching noise
UR - http://www.scopus.com/inward/record.url?scp=0348220492&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0348220492&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0348220492
VL - 42
SP - 6380
EP - 6383
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 10
ER -