Abstract
Simultaneous switching noise and electromagnetic radiation in electronic systems are becoming serious problems with the increase in operating speed of digital circuits. Recently, it was recognized that LSI chips are primary sources of electromagnetic radiation. This paper presents experimental results using two types of test chips, one with and one without an on-chip decoupling capacitor. The effects of the on-chip decoupling capacitor on radiated emission and simultaneous switching noise were characterized by activating I/O circuits or core logic circuits. More than 5 dB of electromagnetic radiation were reduced with the implementation of the on-chip decoupling capacitor for core logic operation.
| Original language | English |
|---|---|
| Pages (from-to) | 6380-6383 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 42 |
| Issue number | 10 |
| Publication status | Published - 2003 Oct 1 |
Keywords
- Electromagnetic radiation
- On-chip decoupling capacitor
- Simultaneous switching noise
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
Fingerprint Dive into the research topics of 'Effects of On-Chip Decoupling Capacitor on Switching Noise and Radiated Emission'. Together they form a unique fingerprint.
Cite this
Sudo, T., Nakano, K., Kudo, J., & Haga, S. (2003). Effects of On-Chip Decoupling Capacitor on Switching Noise and Radiated Emission. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42(10), 6380-6383.