Effects of On-Chip Decoupling Capacitor on Switching Noise and Radiated Emission

Toshio Sudo, Ken Nakano, Junichi Kudo, Satoru Haga

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Simultaneous switching noise and electromagnetic radiation in electronic systems are becoming serious problems with the increase in operating speed of digital circuits. Recently, it was recognized that LSI chips are primary sources of electromagnetic radiation. This paper presents experimental results using two types of test chips, one with and one without an on-chip decoupling capacitor. The effects of the on-chip decoupling capacitor on radiated emission and simultaneous switching noise were characterized by activating I/O circuits or core logic circuits. More than 5 dB of electromagnetic radiation were reduced with the implementation of the on-chip decoupling capacitor for core logic operation.

Original languageEnglish
Pages (from-to)6380-6383
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume42
Issue number10
Publication statusPublished - 2003 Oct

Fingerprint

Electromagnetic waves
decoupling
capacitors
Capacitors
chips
electromagnetic radiation
Logic circuits
Digital circuits
electromagnetic noise
logic circuits
digital electronics
large scale integration
Networks (circuits)
logic
electronics

Keywords

  • Electromagnetic radiation
  • On-chip decoupling capacitor
  • Simultaneous switching noise

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Effects of On-Chip Decoupling Capacitor on Switching Noise and Radiated Emission. / Sudo, Toshio; Nakano, Ken; Kudo, Junichi; Haga, Satoru.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 42, No. 10, 10.2003, p. 6380-6383.

Research output: Contribution to journalArticle

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