Effects of source access resistance on gate lag in AlGaN/GaN HEMTs and current slump behavior

K. Horio, A. Nakajima, K. Itagaki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
Original languageEnglish
Title of host publication65th DRC Device Research Conference
Pages67-68
Number of pages2
DOIs
Publication statusPublished - 2007 Dec 1
Event65th DRC Device Research Conference - South Bend, India
Duration: 2007 Jun 182007 Jun 20

Publication series

Name65th DRC Device Research Conference

Conference

Conference65th DRC Device Research Conference
CountryIndia
CitySouth Bend
Period07/6/1807/6/20

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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