Electrical transport ability of nanostructured potassium-doped titanium oxide film

So Yoon Lee, Ryosuke Matsuno, Kazuhiko Ishihara, Madoka Takai

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Potassium-doped nanostructured titanium oxide films were fabricated using a wet corrosion process with various KOH solutions. The doped condition of potassium in TiO2 was confirmed by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS). Nanotubular were synthesized at a dopant concentration of <0.27%; when the dopant concentration increased to >0.27%, these structures disappeared. To investigate the electrical properties of K-doped TiO2, pseudo metal-oxide-semiconductor field-effect transistor (MOSFET) samples were fabricated. The samples exhibited a distinct electrical behavior and p-type characteristics. The electrical behavior was governed by the volume of the dopant when the dopant concentration was <0.10% and the volume of the TiO2 phase when the dopant concentration was >0.18%.

Original languageEnglish
Article number25803
JournalApplied Physics Express
Volume4
Issue number2
DOIs
Publication statusPublished - 2011 Feb 1
Externally publishedYes

Fingerprint

Titanium oxides
titanium oxides
Oxide films
Potassium
oxide films
potassium
Doping (additives)
metal oxide semiconductors
corrosion
field effect transistors
Raman spectroscopy
electrical properties
photoelectron spectroscopy
MOSFET devices
Electric properties
X ray photoelectron spectroscopy
Corrosion
x rays

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Electrical transport ability of nanostructured potassium-doped titanium oxide film. / Lee, So Yoon; Matsuno, Ryosuke; Ishihara, Kazuhiko; Takai, Madoka.

In: Applied Physics Express, Vol. 4, No. 2, 25803, 01.02.2011.

Research output: Contribution to journalArticle

Lee, So Yoon ; Matsuno, Ryosuke ; Ishihara, Kazuhiko ; Takai, Madoka. / Electrical transport ability of nanostructured potassium-doped titanium oxide film. In: Applied Physics Express. 2011 ; Vol. 4, No. 2.
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