Abstract
The effects of the separation of power/ground lines for the core circuits from that for the I/O circuits and increased on-chip capacitance in a micro-controller chip were examined by using transverse electromagnetic (TEM) cell and a near-field probe system. Further, the combination of power/ground island in PCB for the core circuits was examined and analyzed by a simplified SPICE model.
| Original language | English |
|---|---|
| Pages (from-to) | 781-785 |
| Number of pages | 5 |
| Journal | Proceedings - Electronic Components and Technology Conference |
| Publication status | Published - 2000 Dec 1 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
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Cite this
Sudo, T., Ko, Y., Sakaguchi, S., & Tokumaru, T. (2000). Electromagnetic radiation and simultaneous switching noise in a CMOS device packaging. Proceedings - Electronic Components and Technology Conference, 781-785.