Electromagnetic radiation and simultaneous switching noise in a CMOS device packaging

Toshio Sudo, Yakushi Ko, Shingo Sakaguchi, Takeji Tokumaru

Research output: Contribution to journalConference article

7 Citations (Scopus)

Abstract

The effects of the separation of power/ground lines for the core circuits from that for the I/O circuits and increased on-chip capacitance in a micro-controller chip were examined by using transverse electromagnetic (TEM) cell and a near-field probe system. Further, the combination of power/ground island in PCB for the core circuits was examined and analyzed by a simplified SPICE model.

Original languageEnglish
Pages (from-to)781-785
Number of pages5
JournalProceedings - Electronic Components and Technology Conference
Publication statusPublished - 2000 Dec 1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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