Electron backscatter diffraction analysis applied to [0 0 1] magnetite thin films grown on MgO substrates

Anjela Dimitrova Koblischka-Veneva, Michael Rudolf Koblischka, Y. Zhou, S. Murphy, F. Mücklich, U. Hartmann, I. V. Shvets

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Electron backscatter diffraction (EBSD) analysis is applied to [0 0 1] oriented magnetite thin films grown on MgO substrates. A high image quality of the Kikuchi patterns was achieved enabling multi-phase scans. Several types of magnetite thin films were analyzed; one as-grown and the others after different annealing steps in oxygen atmosphere. From the EBSD mappings, we learn that the optimum orientation in [0 0 1]-direction is not yet achieved for the as-grown sample, but develops upon oxygen treatment. Furthermore, the distribution of misorientation angles within the investigated area (=1 grain) is found to change during the annealing steps. After 3 min of annealing, most of the misorientations around 30°-40° have vanished, and some islands with high misorientation angles remain, which may play a role as antiferromagnetic pinning centers.

Original languageEnglish
JournalJournal of Magnetism and Magnetic Materials
Volume316
Issue number2 SPEC. ISS.
DOIs
Publication statusPublished - 2007 Jan 1
Externally publishedYes

Fingerprint

Ferrosoferric Oxide
Magnetite
Electron diffraction
misalignment
magnetite
Annealing
Thin films
annealing
Substrates
thin films
diffraction
Oxygen
electrons
oxygen
Image quality
atmospheres

Keywords

  • Annealing
  • EBSD
  • Electron backscatter diffraction
  • Magnetite
  • Orientation analysis

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Electron backscatter diffraction analysis applied to [0 0 1] magnetite thin films grown on MgO substrates. / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Zhou, Y.; Murphy, S.; Mücklich, F.; Hartmann, U.; Shvets, I. V.

In: Journal of Magnetism and Magnetic Materials, Vol. 316, No. 2 SPEC. ISS., 01.01.2007.

Research output: Contribution to journalArticle

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AU - Koblischka-Veneva, Anjela Dimitrova

AU - Koblischka, Michael Rudolf

AU - Zhou, Y.

AU - Murphy, S.

AU - Mücklich, F.

AU - Hartmann, U.

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AB - Electron backscatter diffraction (EBSD) analysis is applied to [0 0 1] oriented magnetite thin films grown on MgO substrates. A high image quality of the Kikuchi patterns was achieved enabling multi-phase scans. Several types of magnetite thin films were analyzed; one as-grown and the others after different annealing steps in oxygen atmosphere. From the EBSD mappings, we learn that the optimum orientation in [0 0 1]-direction is not yet achieved for the as-grown sample, but develops upon oxygen treatment. Furthermore, the distribution of misorientation angles within the investigated area (=1 grain) is found to change during the annealing steps. After 3 min of annealing, most of the misorientations around 30°-40° have vanished, and some islands with high misorientation angles remain, which may play a role as antiferromagnetic pinning centers.

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