Abstract
Electron backscatter diffraction (EBSD) analysis is applied to [0 0 1] oriented magnetite thin films grown on MgO substrates. A high image quality of the Kikuchi patterns was achieved enabling multi-phase scans. Several types of magnetite thin films were analyzed; one as-grown and the others after different annealing steps in oxygen atmosphere. From the EBSD mappings, we learn that the optimum orientation in [0 0 1]-direction is not yet achieved for the as-grown sample, but develops upon oxygen treatment. Furthermore, the distribution of misorientation angles within the investigated area (=1 grain) is found to change during the annealing steps. After 3 min of annealing, most of the misorientations around 30°-40° have vanished, and some islands with high misorientation angles remain, which may play a role as antiferromagnetic pinning centers.
| Original language | English |
|---|---|
| Journal | Journal of Magnetism and Magnetic Materials |
| Volume | 316 |
| Issue number | 2 SPEC. ISS. |
| DOIs | |
| Publication status | Published - 2007 Jan 1 |
| Externally published | Yes |
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Keywords
- Annealing
- EBSD
- Electron backscatter diffraction
- Magnetite
- Orientation analysis
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
Cite this
Electron backscatter diffraction analysis applied to [0 0 1] magnetite thin films grown on MgO substrates. / Koblischka-Veneva, Anjela Dimitrova; Koblischka, Michael Rudolf; Zhou, Y.; Murphy, S.; Mücklich, F.; Hartmann, U.; Shvets, I. V.
In: Journal of Magnetism and Magnetic Materials, Vol. 316, No. 2 SPEC. ISS., 01.01.2007.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Electron backscatter diffraction analysis applied to [0 0 1] magnetite thin films grown on MgO substrates
AU - Koblischka-Veneva, Anjela Dimitrova
AU - Koblischka, Michael Rudolf
AU - Zhou, Y.
AU - Murphy, S.
AU - Mücklich, F.
AU - Hartmann, U.
AU - Shvets, I. V.
PY - 2007/1/1
Y1 - 2007/1/1
N2 - Electron backscatter diffraction (EBSD) analysis is applied to [0 0 1] oriented magnetite thin films grown on MgO substrates. A high image quality of the Kikuchi patterns was achieved enabling multi-phase scans. Several types of magnetite thin films were analyzed; one as-grown and the others after different annealing steps in oxygen atmosphere. From the EBSD mappings, we learn that the optimum orientation in [0 0 1]-direction is not yet achieved for the as-grown sample, but develops upon oxygen treatment. Furthermore, the distribution of misorientation angles within the investigated area (=1 grain) is found to change during the annealing steps. After 3 min of annealing, most of the misorientations around 30°-40° have vanished, and some islands with high misorientation angles remain, which may play a role as antiferromagnetic pinning centers.
AB - Electron backscatter diffraction (EBSD) analysis is applied to [0 0 1] oriented magnetite thin films grown on MgO substrates. A high image quality of the Kikuchi patterns was achieved enabling multi-phase scans. Several types of magnetite thin films were analyzed; one as-grown and the others after different annealing steps in oxygen atmosphere. From the EBSD mappings, we learn that the optimum orientation in [0 0 1]-direction is not yet achieved for the as-grown sample, but develops upon oxygen treatment. Furthermore, the distribution of misorientation angles within the investigated area (=1 grain) is found to change during the annealing steps. After 3 min of annealing, most of the misorientations around 30°-40° have vanished, and some islands with high misorientation angles remain, which may play a role as antiferromagnetic pinning centers.
KW - Annealing
KW - EBSD
KW - Electron backscatter diffraction
KW - Magnetite
KW - Orientation analysis
UR - http://www.scopus.com/inward/record.url?scp=34250315778&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34250315778&partnerID=8YFLogxK
U2 - 10.1016/j.jmmm.2007.03.199
DO - 10.1016/j.jmmm.2007.03.199
M3 - Article
VL - 316
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
SN - 0304-8853
IS - 2 SPEC. ISS.
ER -