Electron holographic study of the contact resistance of connected nanowires on resistivity measurement.

M. Takeguchi, M. Shimojo, M. Tanaka, R. Che, W.Zhang W.Zhang, K. Furuya

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)1628-1631
JournalSurf.Interface Anal.
Volume38
Publication statusPublished - 2006 Jan 1

Cite this