Ellipsometric characterization on multi-layered thin film systems during hydrogenation.

D.J. Santjojo, Tatsuhiko Aizawa, Shinji Muraishi

Research output: Research - peer-reviewArticle

LanguageEnglish
Pages1380-1386
JournalMaterials Transactions
Volume48
StatePublished - 1800

Cite this

Ellipsometric characterization on multi-layered thin film systems during hydrogenation. / Santjojo, D.J.; Aizawa, Tatsuhiko; Muraishi, Shinji.

In: Materials Transactions, Vol. 48, 1800, p. 1380-1386.

Research output: Research - peer-reviewArticle

@article{43b7c462421f4cbcba5933c5c67d538f,
title = "Ellipsometric characterization on multi-layered thin film systems during hydrogenation.",
author = "D.J. Santjojo and Tatsuhiko Aizawa and Shinji Muraishi",
year = "1800",
volume = "48",
pages = "1380--1386",
journal = "Materials Transactions",
issn = "1345-9678",
publisher = "Japan Institute of Metals (JIM)",

}

TY - JOUR

T1 - Ellipsometric characterization on multi-layered thin film systems during hydrogenation.

AU - Santjojo,D.J.

AU - Aizawa,Tatsuhiko

AU - Muraishi,Shinji

PY - 1800

Y1 - 1800

M3 - Article

VL - 48

SP - 1380

EP - 1386

JO - Materials Transactions

T2 - Materials Transactions

JF - Materials Transactions

SN - 1345-9678

ER -