Ellipsometric characterization on multi-layered thin film systems during hydrogenation.

D.J. Santjojo, Tatsuhiko Aizawa, Shinji Muraishi

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1380-1386
JournalMaterials Transactions
Volume48
Publication statusPublished - 1800

Cite this

Ellipsometric characterization on multi-layered thin film systems during hydrogenation. / Santjojo, D.J.; Aizawa, Tatsuhiko; Muraishi, Shinji.

In: Materials Transactions, Vol. 48, 1800, p. 1380-1386.

Research output: Contribution to journalArticle

Santjojo, DJ, Aizawa, T & Muraishi, S 1800, 'Ellipsometric characterization on multi-layered thin film systems during hydrogenation.', Materials Transactions, vol. 48, pp. 1380-1386.
Santjojo, D.J. ; Aizawa, Tatsuhiko ; Muraishi, Shinji. / Ellipsometric characterization on multi-layered thin film systems during hydrogenation. In: Materials Transactions. 1800 ; Vol. 48. pp. 1380-1386.
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