EMI peak frequency forecast by power supply transfer impedance with on-chip property

Yusuke Hatogai, Hayato Sasaki, Toshio Sudo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Electromagnetic interference (EMI) forecast is a critical issue in the modern electronic systems. The conventional method of EMI forecast includes the resonance frequency and S parameter of single board itself. However, it was not enough to estimate the worst peak frequency of EMI accurately, because on-chip capacitance affects greatly on the resonance frequency. Therefore, the EMI forecast is required to be improved by including on-chip power distribution network (PDN) and package PDN too. In this paper, transfer impedance of the entire system was precisely analyzed. As a result, it was confirmed that the peak frequency of transfer impedance of total system showed better correlation with the measured peak frequency of EMI.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
DOIs
Publication statusPublished - 2012
EventInternational Symposium on Electromagnetic Compatibility, EMC EUROPE 2012 - Rome
Duration: 2012 Sep 172012 Sep 21

Other

OtherInternational Symposium on Electromagnetic Compatibility, EMC EUROPE 2012
CityRome
Period12/9/1712/9/21

Fingerprint

electromagnetic interference
Signal interference
power supplies
forecasting
chips
impedance
Electric power distribution
Scattering parameters
Capacitance
capacitance
estimates
electronics

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Hatogai, Y., Sasaki, H., & Sudo, T. (2012). EMI peak frequency forecast by power supply transfer impedance with on-chip property. In IEEE International Symposium on Electromagnetic Compatibility [6396879] https://doi.org/10.1109/EMCEurope.2012.6396879

EMI peak frequency forecast by power supply transfer impedance with on-chip property. / Hatogai, Yusuke; Sasaki, Hayato; Sudo, Toshio.

IEEE International Symposium on Electromagnetic Compatibility. 2012. 6396879.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hatogai, Y, Sasaki, H & Sudo, T 2012, EMI peak frequency forecast by power supply transfer impedance with on-chip property. in IEEE International Symposium on Electromagnetic Compatibility., 6396879, International Symposium on Electromagnetic Compatibility, EMC EUROPE 2012, Rome, 12/9/17. https://doi.org/10.1109/EMCEurope.2012.6396879
Hatogai Y, Sasaki H, Sudo T. EMI peak frequency forecast by power supply transfer impedance with on-chip property. In IEEE International Symposium on Electromagnetic Compatibility. 2012. 6396879 https://doi.org/10.1109/EMCEurope.2012.6396879
Hatogai, Yusuke ; Sasaki, Hayato ; Sudo, Toshio. / EMI peak frequency forecast by power supply transfer impedance with on-chip property. IEEE International Symposium on Electromagnetic Compatibility. 2012.
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