EMI peak frequency forecast by power supply transfer impedance with on-chip property

Yusuke Hatogai; Hayato Sasaki; Toshio Sudo

doi:10.1109/EMCEurope.2012.6396879

EMI peak frequency forecast by power supply transfer impedance with on-chip property

Yusuke Hatogai, Hayato Sasaki, Toshio Sudo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Electromagnetic interference (EMI) forecast is a critical issue in the modern electronic systems. The conventional method of EMI forecast includes the resonance frequency and S parameter of single board itself. However, it was not enough to estimate the worst peak frequency of EMI accurately, because on-chip capacitance affects greatly on the resonance frequency. Therefore, the EMI forecast is required to be improved by including on-chip power distribution network (PDN) and package PDN too. In this paper, transfer impedance of the entire system was precisely analyzed. As a result, it was confirmed that the peak frequency of transfer impedance of total system showed better correlation with the measured peak frequency of EMI.

Original language	English
Title of host publication	EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings
DOIs	https://doi.org/10.1109/EMCEurope.2012.6396879
Publication status	Published - 2012 Dec 1
Event	International Symposium on Electromagnetic Compatibility, EMC EUROPE 2012 - Rome, Italy Duration: 2012 Sept 17 → 2012 Sept 21

Publication series

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076
ISSN (Electronic)	2158-1118

Conference

Conference	International Symposium on Electromagnetic Compatibility, EMC EUROPE 2012
Country/Territory	Italy
City	Rome
Period	12/9/17 → 12/9/21

ASJC Scopus subject areas

Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/EMCEurope.2012.6396879

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EMI peak frequency forecast by power supply transfer impedance with on-chip property. / Hatogai, Yusuke; Sasaki, Hayato; Sudo, Toshio.

EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings. 2012. 6396879 (IEEE International Symposium on Electromagnetic Compatibility).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Hatogai, Y, Sasaki, H & Sudo, T 2012, EMI peak frequency forecast by power supply transfer impedance with on-chip property. in EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings., 6396879, IEEE International Symposium on Electromagnetic Compatibility, International Symposium on Electromagnetic Compatibility, EMC EUROPE 2012, Rome, Italy, 12/9/17. https://doi.org/10.1109/EMCEurope.2012.6396879

@inproceedings{bf5dbb5882ee494988910754b94a1354,

title = "EMI peak frequency forecast by power supply transfer impedance with on-chip property",

abstract = "Electromagnetic interference (EMI) forecast is a critical issue in the modern electronic systems. The conventional method of EMI forecast includes the resonance frequency and S parameter of single board itself. However, it was not enough to estimate the worst peak frequency of EMI accurately, because on-chip capacitance affects greatly on the resonance frequency. Therefore, the EMI forecast is required to be improved by including on-chip power distribution network (PDN) and package PDN too. In this paper, transfer impedance of the entire system was precisely analyzed. As a result, it was confirmed that the peak frequency of transfer impedance of total system showed better correlation with the measured peak frequency of EMI.",

author = "Yusuke Hatogai and Hayato Sasaki and Toshio Sudo",

year = "2012",

month = dec,

day = "1",

doi = "10.1109/EMCEurope.2012.6396879",

language = "English",

isbn = "9781467307185",

series = "IEEE International Symposium on Electromagnetic Compatibility",

booktitle = "EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings",

note = "International Symposium on Electromagnetic Compatibility, EMC EUROPE 2012 ; Conference date: 17-09-2012 Through 21-09-2012",

}

TY - GEN

T1 - EMI peak frequency forecast by power supply transfer impedance with on-chip property

AU - Hatogai, Yusuke

AU - Sasaki, Hayato

AU - Sudo, Toshio

PY - 2012/12/1

Y1 - 2012/12/1

N2 - Electromagnetic interference (EMI) forecast is a critical issue in the modern electronic systems. The conventional method of EMI forecast includes the resonance frequency and S parameter of single board itself. However, it was not enough to estimate the worst peak frequency of EMI accurately, because on-chip capacitance affects greatly on the resonance frequency. Therefore, the EMI forecast is required to be improved by including on-chip power distribution network (PDN) and package PDN too. In this paper, transfer impedance of the entire system was precisely analyzed. As a result, it was confirmed that the peak frequency of transfer impedance of total system showed better correlation with the measured peak frequency of EMI.

AB - Electromagnetic interference (EMI) forecast is a critical issue in the modern electronic systems. The conventional method of EMI forecast includes the resonance frequency and S parameter of single board itself. However, it was not enough to estimate the worst peak frequency of EMI accurately, because on-chip capacitance affects greatly on the resonance frequency. Therefore, the EMI forecast is required to be improved by including on-chip power distribution network (PDN) and package PDN too. In this paper, transfer impedance of the entire system was precisely analyzed. As a result, it was confirmed that the peak frequency of transfer impedance of total system showed better correlation with the measured peak frequency of EMI.

UR - http://www.scopus.com/inward/record.url?scp=84872509263&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84872509263&partnerID=8YFLogxK

U2 - 10.1109/EMCEurope.2012.6396879

DO - 10.1109/EMCEurope.2012.6396879

M3 - Conference contribution

AN - SCOPUS:84872509263

SN - 9781467307185

T3 - IEEE International Symposium on Electromagnetic Compatibility

BT - EMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings

T2 - International Symposium on Electromagnetic Compatibility, EMC EUROPE 2012

Y2 - 17 September 2012 through 21 September 2012

ER -

EMI peak frequency forecast by power supply transfer impedance with on-chip property

Abstract

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