Energy filtered scanning confocal electron microscopy (EF-SCEM)

P. Wang, G. Behan, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, A. I. Kirkl, P. D. Nellist

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Sep 1

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