Energy filtered scanning confocal electron microscopy (EF-SCEM)

P. Wang, G. Behan, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, A. I. Kirkl, P. D. Nellist

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Sep 1

Cite this

Wang, P., Behan, G., Hashimoto, A., Takeguchi, M., Mitsuishi, K., Shimojo, M., ... Nellist, P. D. (2010). Energy filtered scanning confocal electron microscopy (EF-SCEM). Default journal.

Energy filtered scanning confocal electron microscopy (EF-SCEM). / Wang, P.; Behan, G.; Hashimoto, A.; Takeguchi, M.; Mitsuishi, K.; Shimojo, M.; Kirkl, A. I.; Nellist, P. D.

In: Default journal, 01.09.2010.

Research output: Contribution to journalArticle

Wang, P, Behan, G, Hashimoto, A, Takeguchi, M, Mitsuishi, K, Shimojo, M, Kirkl, AI & Nellist, PD 2010, 'Energy filtered scanning confocal electron microscopy (EF-SCEM)', Default journal.
Wang P, Behan G, Hashimoto A, Takeguchi M, Mitsuishi K, Shimojo M et al. Energy filtered scanning confocal electron microscopy (EF-SCEM). Default journal. 2010 Sep 1.
Wang, P. ; Behan, G. ; Hashimoto, A. ; Takeguchi, M. ; Mitsuishi, K. ; Shimojo, M. ; Kirkl, A. I. ; Nellist, P. D. / Energy filtered scanning confocal electron microscopy (EF-SCEM). In: Default journal. 2010.
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AU - Behan, G.

AU - Hashimoto, A.

AU - Takeguchi, M.

AU - Mitsuishi, K.

AU - Shimojo, M.

AU - Kirkl, A. I.

AU - Nellist, P. D.

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