Energy filtered scanning confocal electron microscopy (EF-SCEM)

P. Wang, G. Behan, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo, A. I. Kirkl, P. D. Nellist

Research output: Contribution to journalArticle

Original languageEnglish
JournalDefault journal
Publication statusPublished - 2010 Sep 1

Cite this

Wang, P., Behan, G., Hashimoto, A., Takeguchi, M., Mitsuishi, K., Shimojo, M., Kirkl, A. I., & Nellist, P. D. (2010). Energy filtered scanning confocal electron microscopy (EF-SCEM). Default journal.