Abstract
The mechanisms of enhanced excitonic optical nonlinearity in semiconductor microstructures are clarified to be easily attainable state filling of discretized levels due to the quantum size effect and the enhanced oscillator strength. The calculated third-order nonlinear susceptibility explains successfully the recent experimental results. A comprehensive interpretation of the exciton dynamics in semiconductor microcrystallites is presented to explain teh fast and slow decay components in phase conjugation and luminescence measurements.
| Original language | English |
|---|---|
| Pages (from-to) | 590-595 |
| Number of pages | 6 |
| Journal | Surface Science |
| Volume | 196 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 1988 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Condensed Matter Physics
- Surfaces and Interfaces
Cite this
Enhanced excitonic optical nonlinearity and exciton dynamics in semiconductor microstructures. / Takagahara, Toshihide.
In: Surface Science, Vol. 196, No. 1-3, 1988, p. 590-595.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Enhanced excitonic optical nonlinearity and exciton dynamics in semiconductor microstructures
AU - Takagahara, Toshihide
PY - 1988
Y1 - 1988
N2 - The mechanisms of enhanced excitonic optical nonlinearity in semiconductor microstructures are clarified to be easily attainable state filling of discretized levels due to the quantum size effect and the enhanced oscillator strength. The calculated third-order nonlinear susceptibility explains successfully the recent experimental results. A comprehensive interpretation of the exciton dynamics in semiconductor microcrystallites is presented to explain teh fast and slow decay components in phase conjugation and luminescence measurements.
AB - The mechanisms of enhanced excitonic optical nonlinearity in semiconductor microstructures are clarified to be easily attainable state filling of discretized levels due to the quantum size effect and the enhanced oscillator strength. The calculated third-order nonlinear susceptibility explains successfully the recent experimental results. A comprehensive interpretation of the exciton dynamics in semiconductor microcrystallites is presented to explain teh fast and slow decay components in phase conjugation and luminescence measurements.
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UR - http://www.scopus.com/inward/citedby.url?scp=45549118512&partnerID=8YFLogxK
U2 - 10.1016/0039-6028(88)90746-7
DO - 10.1016/0039-6028(88)90746-7
M3 - Article
VL - 196
SP - 590
EP - 595
JO - Surface Science
JF - Surface Science
SN - 0039-6028
IS - 1-3
ER -