Abstract
We have analysed the influence of Ti seed layer (2.0 nm thick) on the agglomeration of Ag films (4.0 nm thick) grown onto MgO(0 0 1) single crystal substrates by RF magnetron sputtering. The samples were deposited at room temperature and post-annealed at 200-450 °C for 4 h while still maintaining the chamber vacuum condition. The surface profile of the sample, as analysed using atomic force microscopy, confirms that the insertion of a Ti seed layer between the MgO substrate and Ag layer promotes the agglomeration process, forming the nanodot. Furthermore, the atomic concentration depth profile of the Ag/Ti/MgO film, as estimated by using angle-resolved x-ray photoelectron spectroscopy, suggests that the nanodot surface mainly consists of Ag. Moreover, x-ray diffraction studies prove that the initial deposition of the Ti seed layer onto MgO(0 0 1) prior to the Ag deposition yields high-quality face-centred cubic (fcc)-Ag(0 0 1) oriented epitaxial nanodots. Based on these results, it can be concluded that the Ti thin film acts as a seed layer, assisting the epitaxial growth of the Ag nanodot onto the MgO substrate.
| Original language | English |
|---|---|
| Article number | 505304 |
| Journal | Journal of Physics D: Applied Physics |
| Volume | 46 |
| Issue number | 50 |
| DOIs | |
| Publication status | Published - 2013 Dec 18 |
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ASJC Scopus subject areas
- Condensed Matter Physics
- Electronic, Optical and Magnetic Materials
- Acoustics and Ultrasonics
- Surfaces, Coatings and Films
Cite this
Epitaxial growth of fcc-Ag(0 0 1) nanodots on MgO(0 0 1) substrates via Ti seed layer-assisted agglomeration. / Kamiko, Masao; Suenaga, Ryo; Koo, Jung Woo; Nose, Kenji; Kyuno, Kentaro; Ha, Jae Geun.
In: Journal of Physics D: Applied Physics, Vol. 46, No. 50, 505304, 18.12.2013.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Epitaxial growth of fcc-Ag(0 0 1) nanodots on MgO(0 0 1) substrates via Ti seed layer-assisted agglomeration
AU - Kamiko, Masao
AU - Suenaga, Ryo
AU - Koo, Jung Woo
AU - Nose, Kenji
AU - Kyuno, Kentaro
AU - Ha, Jae Geun
PY - 2013/12/18
Y1 - 2013/12/18
N2 - We have analysed the influence of Ti seed layer (2.0 nm thick) on the agglomeration of Ag films (4.0 nm thick) grown onto MgO(0 0 1) single crystal substrates by RF magnetron sputtering. The samples were deposited at room temperature and post-annealed at 200-450 °C for 4 h while still maintaining the chamber vacuum condition. The surface profile of the sample, as analysed using atomic force microscopy, confirms that the insertion of a Ti seed layer between the MgO substrate and Ag layer promotes the agglomeration process, forming the nanodot. Furthermore, the atomic concentration depth profile of the Ag/Ti/MgO film, as estimated by using angle-resolved x-ray photoelectron spectroscopy, suggests that the nanodot surface mainly consists of Ag. Moreover, x-ray diffraction studies prove that the initial deposition of the Ti seed layer onto MgO(0 0 1) prior to the Ag deposition yields high-quality face-centred cubic (fcc)-Ag(0 0 1) oriented epitaxial nanodots. Based on these results, it can be concluded that the Ti thin film acts as a seed layer, assisting the epitaxial growth of the Ag nanodot onto the MgO substrate.
AB - We have analysed the influence of Ti seed layer (2.0 nm thick) on the agglomeration of Ag films (4.0 nm thick) grown onto MgO(0 0 1) single crystal substrates by RF magnetron sputtering. The samples were deposited at room temperature and post-annealed at 200-450 °C for 4 h while still maintaining the chamber vacuum condition. The surface profile of the sample, as analysed using atomic force microscopy, confirms that the insertion of a Ti seed layer between the MgO substrate and Ag layer promotes the agglomeration process, forming the nanodot. Furthermore, the atomic concentration depth profile of the Ag/Ti/MgO film, as estimated by using angle-resolved x-ray photoelectron spectroscopy, suggests that the nanodot surface mainly consists of Ag. Moreover, x-ray diffraction studies prove that the initial deposition of the Ti seed layer onto MgO(0 0 1) prior to the Ag deposition yields high-quality face-centred cubic (fcc)-Ag(0 0 1) oriented epitaxial nanodots. Based on these results, it can be concluded that the Ti thin film acts as a seed layer, assisting the epitaxial growth of the Ag nanodot onto the MgO substrate.
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UR - http://www.scopus.com/inward/citedby.url?scp=84894079453&partnerID=8YFLogxK
U2 - 10.1088/0022-3727/46/50/505304
DO - 10.1088/0022-3727/46/50/505304
M3 - Article
VL - 46
JO - Journal Physics D: Applied Physics
JF - Journal Physics D: Applied Physics
SN - 0022-3727
IS - 50
M1 - 505304
ER -