Evaluation of Distinctive PD Parameters in SF6 under ac Voltage

C.Hudon C.Hudon, M.F. Frechette, M. Germain, R.Y.Larocque R.Y.Larocque, Satoshi Matsumoto, Tokihiro Umemura

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	645-650
Journal	IEEE Conf. on Electr. Insul. and Diel. Phen.
Publication status	Published - 2000 Oct 15

Cite this

@article{2ed185a6c2574894aee96bb6aa7603b4,

title = "Evaluation of Distinctive PD Parameters in SF6 under ac Voltage",

author = "C.Hudon C.Hudon and M.F. Frechette and M. Germain and R.Y.Larocque R.Y.Larocque and Satoshi Matsumoto and Tokihiro Umemura",

year = "2000",

month = oct,

day = "15",

language = "English",

pages = "645--650",

journal = "IEEE Conf. on Electr. Insul. and Diel. Phen.",

}

TY - JOUR

T1 - Evaluation of Distinctive PD Parameters in SF6 under ac Voltage

AU - C.Hudon, C.Hudon

AU - Frechette, M.F.

AU - Germain, M.

AU - R.Y.Larocque, R.Y.Larocque

AU - Matsumoto, Satoshi

AU - Umemura, Tokihiro

PY - 2000/10/15

Y1 - 2000/10/15

M3 - Article

SP - 645

EP - 650

JO - IEEE Conf. on Electr. Insul. and Diel. Phen.

JF - IEEE Conf. on Electr. Insul. and Diel. Phen.

ER -