| Original language | English |
|---|---|
| Pages (from-to) | 645-650 |
| Journal | IEEE Conf. on Electr. Insul. and Diel. Phen. |
| Publication status | Published - 2000 Oct 15 |
Cite this
C.Hudon, C. H., Frechette, M. F., Germain, M., R.Y.Larocque, R. Y. L., Matsumoto, S., & Umemura, T. (2000). Evaluation of Distinctive PD Parameters in SF6 under ac Voltage. IEEE Conf. on Electr. Insul. and Diel. Phen., 645-650.
Evaluation of Distinctive PD Parameters in SF6 under ac Voltage. / C.Hudon, C.Hudon; Frechette, M.F.; Germain, M.; R.Y.Larocque, R.Y.Larocque; Matsumoto, Satoshi; Umemura, Tokihiro.
In: IEEE Conf. on Electr. Insul. and Diel. Phen., 15.10.2000, p. 645-650.Research output: Contribution to journal › Article
C.Hudon, CH, Frechette, MF, Germain, M, R.Y.Larocque, RYL, Matsumoto, S & Umemura, T 2000, 'Evaluation of Distinctive PD Parameters in SF6 under ac Voltage', IEEE Conf. on Electr. Insul. and Diel. Phen., pp. 645-650.
C.Hudon CH, Frechette MF, Germain M, R.Y.Larocque RYL, Matsumoto S, Umemura T. Evaluation of Distinctive PD Parameters in SF6 under ac Voltage. IEEE Conf. on Electr. Insul. and Diel. Phen. 2000 Oct 15;645-650.
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title = "Evaluation of Distinctive PD Parameters in SF6 under ac Voltage",
author = "C.Hudon C.Hudon and M.F. Frechette and M. Germain and R.Y.Larocque R.Y.Larocque and Satoshi Matsumoto and Tokihiro Umemura",
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journal = "IEEE Conf. on Electr. Insul. and Diel. Phen.",
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T1 - Evaluation of Distinctive PD Parameters in SF6 under ac Voltage
AU - C.Hudon, C.Hudon
AU - Frechette, M.F.
AU - Germain, M.
AU - R.Y.Larocque, R.Y.Larocque
AU - Matsumoto, Satoshi
AU - Umemura, Tokihiro
PY - 2000/10/15
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JO - IEEE Conf. on Electr. Insul. and Diel. Phen.
JF - IEEE Conf. on Electr. Insul. and Diel. Phen.
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