Abstract
This paper evaluates a needle-free injector using electrically induced bubbles. For a minimally invasive injector, the configuration of the bubble reservoir, which is at the tip space of the bubble injector, must be optimized because the invasiveness depends on the breakdown distance of the electrically induced bubble.
| Original language | English |
|---|---|
| Pages (from-to) | 305-311 |
| Number of pages | 7 |
| Journal | Journal of Microelectromechanical Systems |
| Volume | 27 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 2018 Apr 1 |
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Keywords
- cavitation
- dielectric breakdown
- microbubble
- Needle-free injector
- plasma
ASJC Scopus subject areas
- Mechanical Engineering
- Electrical and Electronic Engineering
Cite this
Evaluation of Invasiveness by Breakdown Phenomena of Electrically Induced Bubbles for a Needle-Free Injector. / Ichikawa, Keita; Maeda, Shingo; Yamanishi, Yoko.
In: Journal of Microelectromechanical Systems, Vol. 27, No. 2, 01.04.2018, p. 305-311.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Evaluation of Invasiveness by Breakdown Phenomena of Electrically Induced Bubbles for a Needle-Free Injector
AU - Ichikawa, Keita
AU - Maeda, Shingo
AU - Yamanishi, Yoko
PY - 2018/4/1
Y1 - 2018/4/1
N2 - This paper evaluates a needle-free injector using electrically induced bubbles. For a minimally invasive injector, the configuration of the bubble reservoir, which is at the tip space of the bubble injector, must be optimized because the invasiveness depends on the breakdown distance of the electrically induced bubble.
AB - This paper evaluates a needle-free injector using electrically induced bubbles. For a minimally invasive injector, the configuration of the bubble reservoir, which is at the tip space of the bubble injector, must be optimized because the invasiveness depends on the breakdown distance of the electrically induced bubble.
KW - cavitation
KW - dielectric breakdown
KW - microbubble
KW - Needle-free injector
KW - plasma
UR - http://www.scopus.com/inward/record.url?scp=85041848690&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85041848690&partnerID=8YFLogxK
U2 - 10.1109/JMEMS.2018.2793314
DO - 10.1109/JMEMS.2018.2793314
M3 - Article
AN - SCOPUS:85041848690
VL - 27
SP - 305
EP - 311
JO - Journal of Microelectromechanical Systems
JF - Journal of Microelectromechanical Systems
SN - 1057-7157
IS - 2
ER -