Evaluation of microscopic structural randomness in SiO2 by analysis of photoluminescence decay profiles

Keisuke Ishii, Kwang Soo Seol, Yoshimichi Ohki, Hiroyuki Nishikawa

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Evaluation of microscopic structural randomness in SiO2 by analysis of photoluminescence decay profiles'. Together they form a unique fingerprint.

Engineering & Materials Science