Experimental characterization of relationship between S parameters and radiated emission for solid and EBG types of power bus structures

Toshio Sudo, Toshimi Kato, Seiju Ichijo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The relationship between S21 properties and far-field radiated emission has been experimentally characterized for various types of power bus structures. As design parameters of power bus structures in printed circuit boards, the effects of VDD plane configuration, insulator thickness between VDD plane and ground plane, on-board capacitors, and signal routing were investigated. First, S21 properties of solid and electromagnetic band-gap (EBG)-type VDD planes were measured for both with and without on-board capacitors. Then, far-field radiated emission was measured for the combination of these design parameters. On-board capacitors induced stop-band in the low frequency range. It has been found that high level of far-field radiated emission was excited at the almost same frequencies of S21 peaks.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
Pages692-695
Number of pages4
Volume3
Publication statusPublished - 2006
Event2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 - Portland, OR
Duration: 2006 Aug 142006 Aug 18

Other

Other2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
CityPortland, OR
Period06/8/1406/8/18

Fingerprint

Scattering parameters
Field emission
far fields
field emission
capacitors
Energy gap
Capacitors
electromagnetism
printed circuits
circuit boards
Printed circuit boards
frequency ranges
insulators
low frequencies
configurations

Keywords

  • Component
  • EBG structure
  • EMI
  • On-board capacitor
  • Power bus structure
  • S21 properties

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Sudo, T., Kato, T., & Ichijo, S. (2006). Experimental characterization of relationship between S parameters and radiated emission for solid and EBG types of power bus structures. In IEEE International Symposium on Electromagnetic Compatibility (Vol. 3, pp. 692-695). [1706398]

Experimental characterization of relationship between S parameters and radiated emission for solid and EBG types of power bus structures. / Sudo, Toshio; Kato, Toshimi; Ichijo, Seiju.

IEEE International Symposium on Electromagnetic Compatibility. Vol. 3 2006. p. 692-695 1706398.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sudo, T, Kato, T & Ichijo, S 2006, Experimental characterization of relationship between S parameters and radiated emission for solid and EBG types of power bus structures. in IEEE International Symposium on Electromagnetic Compatibility. vol. 3, 1706398, pp. 692-695, 2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006, Portland, OR, 06/8/14.
Sudo T, Kato T, Ichijo S. Experimental characterization of relationship between S parameters and radiated emission for solid and EBG types of power bus structures. In IEEE International Symposium on Electromagnetic Compatibility. Vol. 3. 2006. p. 692-695. 1706398
Sudo, Toshio ; Kato, Toshimi ; Ichijo, Seiju. / Experimental characterization of relationship between S parameters and radiated emission for solid and EBG types of power bus structures. IEEE International Symposium on Electromagnetic Compatibility. Vol. 3 2006. pp. 692-695
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