Experimental characterization of relationship between S parameters and radiated emission for solid and EBG types of power bus structures

Toshio Sudo, Toshimi Kato, Seiju Ichijo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The relationship between S21 properties and far-field radiated emission has been experimentally characterized for various types of power bus structures. As design parameters of power bus structures in printed circuit boards, the effects of VDD plane configuration, insulator thickness between VDD plane and ground plane, on-board capacitors, and signal routing were investigated. First, S21 properties of solid and electromagnetic band-gap (EBG)-type VDD planes were measured for both with and without on-board capacitors. Then, far-field radiated emission was measured for the combination of these design parameters. On-board capacitors induced stop-band in the low frequency range. It has been found that high level of far-field radiated emission was excited at the almost same frequencies of S21 peaks.

Original languageEnglish
Title of host publication2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages692-695
Number of pages4
ISBN (Print)142440293X, 9781424402939
DOIs
Publication statusPublished - 2006
Event2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 - Portland, OR, United States
Duration: 2006 Aug 142006 Aug 18

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume3
ISSN (Print)1077-4076

Conference

Conference2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006
CountryUnited States
CityPortland, OR
Period06/8/1406/8/18

Keywords

  • Component
  • EBG structure
  • EMI
  • On-board capacitor
  • Power bus structure
  • S21 properties

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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    Sudo, T., Kato, T., & Ichijo, S. (2006). Experimental characterization of relationship between S parameters and radiated emission for solid and EBG types of power bus structures. In 2006 IEEE International Symposium on Electromagnetic Compatibility, EMC 2006 (pp. 692-695). [1706398] (IEEE International Symposium on Electromagnetic Compatibility; Vol. 3). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/isemc.2006.1706398