Experimental characterization of simultaneous switching noise for multichip module

Kenji Ito, Katsuto Kato, Naohiko Hirano, Toshio Sudo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

CMOS-based multichip modules have been actively developed for achieving high performance and high speed systems. Simultaneous switching noise (SSN) induced by CMOS output buffers is a serious issue in multichip modules as well as single-chip packages to ensure stable operation and to derive inherent speed performance. Multichip modules are expected to have smaller switching noise level than the case of single-chip packages by removing a first-level package and its parasitics. This paper reports the measurement results of switching noises for different types of MCMs using a switching noise generating chip. Two types of test vehicles were fabricated and measurement results were compared. Noise distribution on a ground plane was also measured.

Original languageEnglish
Title of host publicationProceedings of the IEEE Multi-Chip Module Conference
Place of PublicationLos Alamitos, CA, United States
PublisherIEEE
Pages217-220
Number of pages4
Publication statusPublished - 1995
EventProceedings of the 1995 IEEE Multi-Chip Module Conference - Santa Cruz, CA, USA
Duration: 1995 Jan 311995 Feb 2

Other

OtherProceedings of the 1995 IEEE Multi-Chip Module Conference
CitySanta Cruz, CA, USA
Period95/1/3195/2/2

Fingerprint

Multichip modules
Multicarrier modulation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Ito, K., Kato, K., Hirano, N., & Sudo, T. (1995). Experimental characterization of simultaneous switching noise for multichip module. In Proceedings of the IEEE Multi-Chip Module Conference (pp. 217-220). Los Alamitos, CA, United States: IEEE.

Experimental characterization of simultaneous switching noise for multichip module. / Ito, Kenji; Kato, Katsuto; Hirano, Naohiko; Sudo, Toshio.

Proceedings of the IEEE Multi-Chip Module Conference. Los Alamitos, CA, United States : IEEE, 1995. p. 217-220.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ito, K, Kato, K, Hirano, N & Sudo, T 1995, Experimental characterization of simultaneous switching noise for multichip module. in Proceedings of the IEEE Multi-Chip Module Conference. IEEE, Los Alamitos, CA, United States, pp. 217-220, Proceedings of the 1995 IEEE Multi-Chip Module Conference, Santa Cruz, CA, USA, 95/1/31.
Ito K, Kato K, Hirano N, Sudo T. Experimental characterization of simultaneous switching noise for multichip module. In Proceedings of the IEEE Multi-Chip Module Conference. Los Alamitos, CA, United States: IEEE. 1995. p. 217-220
Ito, Kenji ; Kato, Katsuto ; Hirano, Naohiko ; Sudo, Toshio. / Experimental characterization of simultaneous switching noise for multichip module. Proceedings of the IEEE Multi-Chip Module Conference. Los Alamitos, CA, United States : IEEE, 1995. pp. 217-220
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