Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images

Ayako Hashimoto, Kazutaka Mitsuishi, Masayuki Shimojo, Yufang Zhu, Masaki Takeguchi

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We experimentally examined the characteristics of bright-field (BF) scanning confocal electron microscopy (SCEM) images by changing the observation conditions and comparing the images with those obtained by BF transmission electron microscopy (TEM) and BF scanning TEM (STEM) modes. The observation of 5-nm-diameter Au nanoparticles demonstrated that BF-SCEM produces object elongation of more than 2000 nm along the optical axis, as do BF-TEM and BF-STEM. We demonstrated the relationship between elongation length and geometric effects such as convergence and collection angles of a probe and the lateral size of an object; the relationship is consistent with previous theoretical prediction. Further, we observed interesting features that are seen only in the BF-SCEM images; the film contrast was strongly enhanced, compared with that of BF-STEM. In addition, a bright contrast appeared around the object position in the elongated images. Using this characteristic, we could determine the object position and structure.

Original languageEnglish
Pages (from-to)227-234
Number of pages8
JournalJournal of Electron Microscopy
Volume60
Issue number3
DOIs
Publication statusPublished - 2011 Jun
Externally publishedYes

Fingerprint

Confocal microscopy
Electron microscopy
examination
Transmission electron microscopy
Scanning
transmission electron microscopy
scanning electron microscopy
elongation
Elongation
scanning
Nanoparticles
nanoparticles
Scanning electron microscopy
probes
predictions

Keywords

  • bright-field imaging
  • confocal imaging
  • depth sectioning
  • scanning confocal electron microscopy
  • stage-scanning system
  • three-dimensional imaging

ASJC Scopus subject areas

  • Instrumentation

Cite this

Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images. / Hashimoto, Ayako; Mitsuishi, Kazutaka; Shimojo, Masayuki; Zhu, Yufang; Takeguchi, Masaki.

In: Journal of Electron Microscopy, Vol. 60, No. 3, 06.2011, p. 227-234.

Research output: Contribution to journalArticle

Hashimoto, Ayako ; Mitsuishi, Kazutaka ; Shimojo, Masayuki ; Zhu, Yufang ; Takeguchi, Masaki. / Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images. In: Journal of Electron Microscopy. 2011 ; Vol. 60, No. 3. pp. 227-234.
@article{47cfe9114d3642ca98dbf119bb99e558,
title = "Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images",
abstract = "We experimentally examined the characteristics of bright-field (BF) scanning confocal electron microscopy (SCEM) images by changing the observation conditions and comparing the images with those obtained by BF transmission electron microscopy (TEM) and BF scanning TEM (STEM) modes. The observation of 5-nm-diameter Au nanoparticles demonstrated that BF-SCEM produces object elongation of more than 2000 nm along the optical axis, as do BF-TEM and BF-STEM. We demonstrated the relationship between elongation length and geometric effects such as convergence and collection angles of a probe and the lateral size of an object; the relationship is consistent with previous theoretical prediction. Further, we observed interesting features that are seen only in the BF-SCEM images; the film contrast was strongly enhanced, compared with that of BF-STEM. In addition, a bright contrast appeared around the object position in the elongated images. Using this characteristic, we could determine the object position and structure.",
keywords = "bright-field imaging, confocal imaging, depth sectioning, scanning confocal electron microscopy, stage-scanning system, three-dimensional imaging",
author = "Ayako Hashimoto and Kazutaka Mitsuishi and Masayuki Shimojo and Yufang Zhu and Masaki Takeguchi",
year = "2011",
month = "6",
doi = "10.1093/jmicro/dfr013",
language = "English",
volume = "60",
pages = "227--234",
journal = "Microscopy (Oxford, England)",
issn = "2050-5698",
publisher = "Japanese Society of Microscopy",
number = "3",

}

TY - JOUR

T1 - Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images

AU - Hashimoto, Ayako

AU - Mitsuishi, Kazutaka

AU - Shimojo, Masayuki

AU - Zhu, Yufang

AU - Takeguchi, Masaki

PY - 2011/6

Y1 - 2011/6

N2 - We experimentally examined the characteristics of bright-field (BF) scanning confocal electron microscopy (SCEM) images by changing the observation conditions and comparing the images with those obtained by BF transmission electron microscopy (TEM) and BF scanning TEM (STEM) modes. The observation of 5-nm-diameter Au nanoparticles demonstrated that BF-SCEM produces object elongation of more than 2000 nm along the optical axis, as do BF-TEM and BF-STEM. We demonstrated the relationship between elongation length and geometric effects such as convergence and collection angles of a probe and the lateral size of an object; the relationship is consistent with previous theoretical prediction. Further, we observed interesting features that are seen only in the BF-SCEM images; the film contrast was strongly enhanced, compared with that of BF-STEM. In addition, a bright contrast appeared around the object position in the elongated images. Using this characteristic, we could determine the object position and structure.

AB - We experimentally examined the characteristics of bright-field (BF) scanning confocal electron microscopy (SCEM) images by changing the observation conditions and comparing the images with those obtained by BF transmission electron microscopy (TEM) and BF scanning TEM (STEM) modes. The observation of 5-nm-diameter Au nanoparticles demonstrated that BF-SCEM produces object elongation of more than 2000 nm along the optical axis, as do BF-TEM and BF-STEM. We demonstrated the relationship between elongation length and geometric effects such as convergence and collection angles of a probe and the lateral size of an object; the relationship is consistent with previous theoretical prediction. Further, we observed interesting features that are seen only in the BF-SCEM images; the film contrast was strongly enhanced, compared with that of BF-STEM. In addition, a bright contrast appeared around the object position in the elongated images. Using this characteristic, we could determine the object position and structure.

KW - bright-field imaging

KW - confocal imaging

KW - depth sectioning

KW - scanning confocal electron microscopy

KW - stage-scanning system

KW - three-dimensional imaging

UR - http://www.scopus.com/inward/record.url?scp=79958800842&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79958800842&partnerID=8YFLogxK

U2 - 10.1093/jmicro/dfr013

DO - 10.1093/jmicro/dfr013

M3 - Article

C2 - 21486860

AN - SCOPUS:79958800842

VL - 60

SP - 227

EP - 234

JO - Microscopy (Oxford, England)

JF - Microscopy (Oxford, England)

SN - 2050-5698

IS - 3

ER -