Extremely low-noise performance of GaAs MESFET's with wide-head T-shaped gate

Kiyomitsu Onodera, Kazumi Nishimura, Shinji Aoyama, Suehiro Sugitani, Yasuro Yamane, Makoto Hirano

    Research output: Contribution to journalArticle

    23 Citations (Scopus)

    Abstract

    Fully ion-implanted low-noise GaAs MESFET's with a 0.11-m Au/WSiN T-shaped gate have been successfully developed for applications in monolithic microwave and millimeterwave integrated circuits (MMIC's). In order to reduce the gate resistance, a wide Au gate head made of a first-level interconnect is employed. As the wide gate head results in parasitic capacitance, the relation between the gate head length (Lfe) and the device performance is examined. The gate resistance is also precisely calculated using the cold FET technique and Mahon and Anhold's method. A current gain cutoff frequency (/T) and a maximum stable gain (MSG) decrease monotonously as L/, increases on account of parasitic capacitance. However, the device with Lfc of 1.0 pm, which has lower gate resistance than 1.0 fi, exhibits a noise figure of 0.78 dB with an associated gain of 8.7 dB at an operating frequency of 26 GHz. The measured noise figure is comparable to that of GaAs-based HEMT's.

    Original languageEnglish
    Pages (from-to)310-319
    Number of pages10
    JournalIEEE Transactions on Electron Devices
    Volume46
    Issue number2
    DOIs
    Publication statusPublished - 1999 Dec 1

    Keywords

    • Gaas
    • Gate resistance
    • MESFET
    • Noise performance
    • Semiconductor device fabrication

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

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  • Cite this

    Onodera, K., Nishimura, K., Aoyama, S., Sugitani, S., Yamane, Y., & Hirano, M. (1999). Extremely low-noise performance of GaAs MESFET's with wide-head T-shaped gate. IEEE Transactions on Electron Devices, 46(2), 310-319. https://doi.org/10.1109/16.740895