Fabrication and characterization of fine focused electron with scanning transmission electron microscopy

K. Furuya, K. Mitsuishi, M. Shimojo [Unknown], M. Tanaka, Masayuki Shimojo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)54
JournalDefault journal
Publication statusPublished - 2004 Jun 1

Cite this

Fabrication and characterization of fine focused electron with scanning transmission electron microscopy. / Furuya, K.; Mitsuishi, K.; [Unknown], M. Shimojo; Tanaka, M.; Shimojo, Masayuki.

In: Default journal, 01.06.2004, p. 54.

Research output: Contribution to journalArticle

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AU - Tanaka, M.

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