Far-field diffraction patterns of a dot array with Gaussian random fluctuations

Rajagopalan Uma Maheswari, Toshimitsu Asakura, Nobukatsu Takai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A theoretical and experimental investigation on the far-field diffraction patterns of a dot array with Gaussian random fluctuations has been done quantitatively by means of a generalized fluctuation parameter. It has been found that the exposure condition strongly influences the nature of the observed photographic pattern and hence the observation of the light-depletion phenomenon first reported by Stark and later, analyzed by Martin and Aime.

Original languageEnglish
Title of host publicationOptical Computing
EditorsFedor V. Karpushko, George V. Sinitsyn, Sergey P. Apanasevich, Andrey M. Goncharenko
PublisherSPIE
Pages151-162
Number of pages12
ISBN (Electronic)9780819410061
DOIs
Publication statusPublished - 1993 Jul 12
EventTopical Meeting on Optical Computing 1992 - Minsk, Belarus
Duration: 1992 Jun 291992 Jul 1

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1806
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherTopical Meeting on Optical Computing 1992
CountryBelarus
CityMinsk
Period92/6/2992/7/1

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Maheswari, R. U., Asakura, T., & Takai, N. (1993). Far-field diffraction patterns of a dot array with Gaussian random fluctuations. In F. V. Karpushko, G. V. Sinitsyn, S. P. Apanasevich, & A. M. Goncharenko (Eds.), Optical Computing (pp. 151-162). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1806). SPIE. https://doi.org/10.1117/12.147823