Field trapping property of HTS bulk magnet with reduced voids in pulsed field magnetizing process

T. Oka, H. Seki, D. Ishiduka, J. Ogawa, S. Fukui, T. Sato, K. Yokoyama, A. Murakami

Research output: Contribution to journal › Conference article › peer-review

5 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Field trapping property of HTS bulk magnet with reduced voids in pulsed field magnetizing process'. Together they form a unique fingerprint.

Physics & Astronomy