Flux penetration into YBa2Cu3Ox thin films covering substrate step edges

Th Schuster, M. R. Koblischka, H. Kuhn, H. Kronmüller, G. Friedl, B. Roas, L. Schultz

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Abstract

Using the high-resolution Faraday effect, the flux penetration into YBa2Cu3Ox thin films grown over one or two substrate step edges is directly observed at a temperature of T=5 K. The regions at the steps are easily penetrated by the flux already present at low applied external magnetic fields due to the locally enhanced stray fields. The step edges are found to separate the sample magnetically into independent parts. It is also shown that the local observation of flux penetration allows detection of the influence of defects in the thin-film samples on the domain structures in a direct way.

Original languageEnglish
Pages (from-to)768-770
Number of pages3
JournalApplied Physics Letters
Volume62
Issue number7
DOIs
Publication statusPublished - 1993 Dec 1

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Schuster, T., Koblischka, M. R., Kuhn, H., Kronmüller, H., Friedl, G., Roas, B., & Schultz, L. (1993). Flux penetration into YBa2Cu3Ox thin films covering substrate step edges. Applied Physics Letters, 62(7), 768-770. https://doi.org/10.1063/1.108573