Flux penetration into YBa2Cu3Ox thin films covering substrate step edges

Th Schuster, Michael Rudolf Koblischka, H. Kuhn, H. Kronmüller, G. Friedl, B. Roas, L. Schultz

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Using the high-resolution Faraday effect, the flux penetration into YBa2Cu3Ox thin films grown over one or two substrate step edges is directly observed at a temperature of T=5 K. The regions at the steps are easily penetrated by the flux already present at low applied external magnetic fields due to the locally enhanced stray fields. The step edges are found to separate the sample magnetically into independent parts. It is also shown that the local observation of flux penetration allows detection of the influence of defects in the thin-film samples on the domain structures in a direct way.

Original languageEnglish
Pages (from-to)768-770
Number of pages3
JournalApplied Physics Letters
Volume62
Issue number7
DOIs
Publication statusPublished - 1993 Dec 1
Externally publishedYes

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coverings
penetration
thin films
Faraday effect
high resolution
defects
magnetic fields
temperature

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Schuster, T., Koblischka, M. R., Kuhn, H., Kronmüller, H., Friedl, G., Roas, B., & Schultz, L. (1993). Flux penetration into YBa2Cu3Ox thin films covering substrate step edges. Applied Physics Letters, 62(7), 768-770. https://doi.org/10.1063/1.108573

Flux penetration into YBa2Cu3Ox thin films covering substrate step edges. / Schuster, Th; Koblischka, Michael Rudolf; Kuhn, H.; Kronmüller, H.; Friedl, G.; Roas, B.; Schultz, L.

In: Applied Physics Letters, Vol. 62, No. 7, 01.12.1993, p. 768-770.

Research output: Contribution to journalArticle

Schuster, T, Koblischka, MR, Kuhn, H, Kronmüller, H, Friedl, G, Roas, B & Schultz, L 1993, 'Flux penetration into YBa2Cu3Ox thin films covering substrate step edges', Applied Physics Letters, vol. 62, no. 7, pp. 768-770. https://doi.org/10.1063/1.108573
Schuster, Th ; Koblischka, Michael Rudolf ; Kuhn, H. ; Kronmüller, H. ; Friedl, G. ; Roas, B. ; Schultz, L. / Flux penetration into YBa2Cu3Ox thin films covering substrate step edges. In: Applied Physics Letters. 1993 ; Vol. 62, No. 7. pp. 768-770.
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