Flux pinning property in a single crystal NdBa2Cu 3Oy superconductor

M. N. Hasan, T. Kurokawa, M. Kiuchi, E. S. Otabe, T. Matsushita, N. Chikumoto, T. MacHi, M. Muralidhar, M. Murakami

Research output: Contribution to journalConference article

2 Citations (Scopus)

Abstract

The critical current density Jc and the apparent pinning potential U0 * in a single crystal NdBa2Cu 3Oy superconductor which shows a broad peak effect are investigated by measuring a DC magnetization and its relaxation. The field-induced pinning mechanism does not explain the temperature dependence of peak field Bp and dip field Bd. The experimental results of Jc and U0* are compared with the theoretical analysis based on the flux creep-flow model, taking the distribution of the flux pinning strength into account. The number of flux lines in the flux bundle (g2), the most probable value of pinning strength (Am) and distribution width (σ2) are determined so that a good fit is obtained between the experimental and theoretical results. The behavior of these parameters is discussed in correspondence to the disorder transition of flux lines.

Original languageEnglish
Pages (from-to)295-299
Number of pages5
JournalPhysica C: Superconductivity and its applications
Volume426-431
Issue numberI
DOIs
Publication statusPublished - 2005 Oct 1
EventProceedings of the 17th International Symposium on Superconductivity (ISS 2004) Advances in Supeconductivity -
Duration: 2004 Nov 232004 Nov 25

Keywords

  • Disorder transition of flux lines
  • Field-induced pinning
  • Flux creep-flow model
  • NdBaCuO superconductor
  • Peak effect

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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    Hasan, M. N., Kurokawa, T., Kiuchi, M., Otabe, E. S., Matsushita, T., Chikumoto, N., MacHi, T., Muralidhar, M., & Murakami, M. (2005). Flux pinning property in a single crystal NdBa2Cu 3Oy superconductor. Physica C: Superconductivity and its applications, 426-431(I), 295-299. https://doi.org/10.1016/j.physc.2005.01.024