GaN surface ablation by fs-pulses: atomic force microscopy studies, accumulation effects

Petr G. Eliseev, Saulius Juodkazis, Tamoya Sugahara, Hong Bo Sun, Shigeki Matsuo, Shiro Sakai, Hiroaki Misawa

Research output: Contribution to journalConference articlepeer-review

7 Citations (Scopus)

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