High frequency magnetic force microscopy-imaging of harddisk write heads

Michael Rudolf Koblischka, Jian Dong Wei, Michael Kirsch, Uwe Hartmann

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

A high-frequency magnetic force microscope (HF-MFM) is built up for the observation of the high-frequency stray fields of harddisk write heads. We demonstrate the performance of the system using harddisk write heads from different manufacturers. We show that the use of advanced high-aspect ratio MFM cantilevers yields HF-MFM images with clearly improved spatial resolution. Furthermore, we present results obtained using MFM cantilevers with a magnetic coating of Ba3Co2Fe24O41 (BCFO).

Original languageEnglish
Pages (from-to)2238-2241
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume45
Issue number3 B
DOIs
Publication statusPublished - 2006 Mar 27
Externally publishedYes

Fingerprint

Magnetic force microscopy
magnetic force microscopy
Microscopes
Imaging techniques
microscopes
Aspect ratio
high aspect ratio
Coatings
spatial resolution
coatings

Keywords

  • Advanced cantilevers
  • Ferrites
  • Harddisk write head
  • High-frequency response
  • Magnetic force microscopy

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

High frequency magnetic force microscopy-imaging of harddisk write heads. / Koblischka, Michael Rudolf; Wei, Jian Dong; Kirsch, Michael; Hartmann, Uwe.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 45, No. 3 B, 27.03.2006, p. 2238-2241.

Research output: Contribution to journalArticle

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