High-frequency MFM characterization of magnetic recording writer poles

Michael Rudolf Koblischka, J. D. Wei, T. Sulzbach, U. Hartmann

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

By means of high-frequency magnetic force microscopy (HF-MFM), different magnetic recording writer poles are characterized in the frequency range 200- 1500 MHz using the dual-vibrational HF-MFM technique. The stray fields emanating from hard disk writer poles stemming from different makers are compared to each other, and the field distributions obtained at different carrier frequencies are analysed. At low carrier frequencies, the maximum field is located directly at the gap, whereas at high frequencies two distinct maxima before and after the gap are observed.

Original languageEnglish
Pages (from-to)235-240
Number of pages6
JournalApplied Physics A: Materials Science and Processing
Volume94
Issue number2
DOIs
Publication statusPublished - 2009 Feb 1
Externally publishedYes

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Magnetic force microscopy
Magnetic recording
Poles
Hard disk storage

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)

Cite this

High-frequency MFM characterization of magnetic recording writer poles. / Koblischka, Michael Rudolf; Wei, J. D.; Sulzbach, T.; Hartmann, U.

In: Applied Physics A: Materials Science and Processing, Vol. 94, No. 2, 01.02.2009, p. 235-240.

Research output: Contribution to journalArticle

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