High speed cell stiffness evaluation toward 100% reliability

Yuki Hirose, Makoto Kaneko, Tomohiro Kawahara, Yoko Yamanishi, Fumihito Arai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper proposes a high speed cell stiffness evaluation with high reliability. The procedure includes both online measurement and offline inspection. By using the property where the passing time of the cell in the micro channel is a function of the cell stiffness and its size, a real time vision system whose handling frequency is 6 kHz can capture the size as well as the passing time of each cell. During the online measurement, we save two image data at both the entrance and the exit for each cell. In offline manual inspection, all doubtful data are killed so that we can make sure the reliability. Experimental results ensure that the proposed approach can handle 500 cells within 10min in including both online and offline procedures.

Original languageEnglish
Title of host publicationProceedings of IEEE Sensors
Pages962-965
Number of pages4
DOIs
Publication statusPublished - 2011
Externally publishedYes
Event10th IEEE SENSORS Conference 2011, SENSORS 2011 - Limerick
Duration: 2011 Oct 282011 Oct 31

Other

Other10th IEEE SENSORS Conference 2011, SENSORS 2011
CityLimerick
Period11/10/2811/10/31

Fingerprint

Inspection
Stiffness

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Hirose, Y., Kaneko, M., Kawahara, T., Yamanishi, Y., & Arai, F. (2011). High speed cell stiffness evaluation toward 100% reliability. In Proceedings of IEEE Sensors (pp. 962-965). [6127399] https://doi.org/10.1109/ICSENS.2011.6127399

High speed cell stiffness evaluation toward 100% reliability. / Hirose, Yuki; Kaneko, Makoto; Kawahara, Tomohiro; Yamanishi, Yoko; Arai, Fumihito.

Proceedings of IEEE Sensors. 2011. p. 962-965 6127399.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hirose, Y, Kaneko, M, Kawahara, T, Yamanishi, Y & Arai, F 2011, High speed cell stiffness evaluation toward 100% reliability. in Proceedings of IEEE Sensors., 6127399, pp. 962-965, 10th IEEE SENSORS Conference 2011, SENSORS 2011, Limerick, 11/10/28. https://doi.org/10.1109/ICSENS.2011.6127399
Hirose Y, Kaneko M, Kawahara T, Yamanishi Y, Arai F. High speed cell stiffness evaluation toward 100% reliability. In Proceedings of IEEE Sensors. 2011. p. 962-965. 6127399 https://doi.org/10.1109/ICSENS.2011.6127399
Hirose, Yuki ; Kaneko, Makoto ; Kawahara, Tomohiro ; Yamanishi, Yoko ; Arai, Fumihito. / High speed cell stiffness evaluation toward 100% reliability. Proceedings of IEEE Sensors. 2011. pp. 962-965
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