High speed cell stiffness evaluation toward 100% reliability

Yuki Hirose; Makoto Kaneko; Tomohiro Kawahara; Yoko Yamanishi; Fumihito Arai

doi:10.1109/ICSENS.2011.6127399

High speed cell stiffness evaluation toward 100% reliability

Yuki Hirose, Makoto Kaneko, Tomohiro Kawahara, Yoko Yamanishi, Fumihito Arai

Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

This paper proposes a high speed cell stiffness evaluation with high reliability. The procedure includes both online measurement and offline inspection. By using the property where the passing time of the cell in the micro channel is a function of the cell stiffness and its size, a real time vision system whose handling frequency is 6 kHz can capture the size as well as the passing time of each cell. During the online measurement, we save two image data at both the entrance and the exit for each cell. In offline manual inspection, all doubtful data are killed so that we can make sure the reliability. Experimental results ensure that the proposed approach can handle 500 cells within 10min in including both online and offline procedures.

Original language	English
Title of host publication	IEEE Sensors 2011 Conference, SENSORS 2011
Pages	962-965
Number of pages	4
DOIs	https://doi.org/10.1109/ICSENS.2011.6127399
Publication status	Published - 2011 Dec 1
Event	10th IEEE SENSORS Conference 2011, SENSORS 2011 - Limerick, Ireland Duration: 2011 Oct 28 → 2011 Oct 31

Publication series

Name	Proceedings of IEEE Sensors

Conference

Conference	10th IEEE SENSORS Conference 2011, SENSORS 2011
Country	Ireland
City	Limerick
Period	11/10/28 → 11/10/31

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/ICSENS.2011.6127399

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Hirose, Y., Kaneko, M., Kawahara, T., Yamanishi, Y., & Arai, F. (2011). High speed cell stiffness evaluation toward 100% reliability. In IEEE Sensors 2011 Conference, SENSORS 2011 (pp. 962-965). [6127399] (Proceedings of IEEE Sensors). https://doi.org/10.1109/ICSENS.2011.6127399

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