High speed cell stiffness evaluation toward 100% reliability

Yuki Hirose; Makoto Kaneko; Tomohiro Kawahara; Yoko Yamanishi; Fumihito Arai

doi:10.1109/ICSENS.2011.6127399

High speed cell stiffness evaluation toward 100% reliability

Yuki Hirose, Makoto Kaneko, Tomohiro Kawahara, Yoko Yamanishi, Fumihito Arai

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

This paper proposes a high speed cell stiffness evaluation with high reliability. The procedure includes both online measurement and offline inspection. By using the property where the passing time of the cell in the micro channel is a function of the cell stiffness and its size, a real time vision system whose handling frequency is 6 kHz can capture the size as well as the passing time of each cell. During the online measurement, we save two image data at both the entrance and the exit for each cell. In offline manual inspection, all doubtful data are killed so that we can make sure the reliability. Experimental results ensure that the proposed approach can handle 500 cells within 10min in including both online and offline procedures.

Original language	English
Title of host publication	Proceedings of IEEE Sensors
Pages	962-965
Number of pages	4
DOIs	https://doi.org/10.1109/ICSENS.2011.6127399
Publication status	Published - 2011
Externally published	Yes
Event	10th IEEE SENSORS Conference 2011, SENSORS 2011 - Limerick Duration: 2011 Oct 28 → 2011 Oct 31

Other

Other	10th IEEE SENSORS Conference 2011, SENSORS 2011
City	Limerick
Period	11/10/28 → 11/10/31

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ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Hirose, Y., Kaneko, M., Kawahara, T., Yamanishi, Y., & Arai, F. (2011). High speed cell stiffness evaluation toward 100% reliability. In Proceedings of IEEE Sensors (pp. 962-965). [6127399] https://doi.org/10.1109/ICSENS.2011.6127399

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Access to Document

10.1109/ICSENS.2011.6127399