Image analysis of hair - Hair roots extraction

Shun Negishi, Masanobu Takahashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

There are many people suffering from loss of hair or thinning hair. There are, however, no methods to quantitatively know their hair condition such as hair density and hair thickness without cutting the hairs. Our final target is to develop a system which enables general people to easily and quantitatively know their hair condition without cutting the hairs. As the first step, a method has been developed to extract the positions of the hair roots. The method covers the case where the hairs are extracted by binarization. Preliminary results show promising performance of about 82% F-measure.

Original languageEnglish
Title of host publication2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1047-1049
Number of pages3
Volume2017-November
ISBN (Electronic)9784907764579
DOIs
Publication statusPublished - 2017 Nov 10
Event56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017 - Kanazawa, Japan
Duration: 2017 Sep 192017 Sep 22

Other

Other56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017
CountryJapan
CityKanazawa
Period17/9/1917/9/22

Keywords

  • Hair
  • Hair density
  • Hair root
  • Image
  • Phototrichogram

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Optimization
  • Control and Systems Engineering
  • Instrumentation

Fingerprint Dive into the research topics of 'Image analysis of hair - Hair roots extraction'. Together they form a unique fingerprint.

  • Cite this

    Negishi, S., & Takahashi, M. (2017). Image analysis of hair - Hair roots extraction. In 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan, SICE 2017 (Vol. 2017-November, pp. 1047-1049). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/SICE.2017.8105560