Improvement in depth resolution of scanning confocal electron microscopy

X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)178
JournalDefault journal
Volume45
Publication statusPublished - 2010 May 24

Cite this

Zhang, X., Takeguchi, M., Hashimoto, A., Mitsuishi, K., & Shimojo, M. (2010). Improvement in depth resolution of scanning confocal electron microscopy. Default journal, 45, 178.

Improvement in depth resolution of scanning confocal electron microscopy. / Zhang, X.; Takeguchi, M.; Hashimoto, A.; Mitsuishi, K.; Shimojo, M.

In: Default journal, Vol. 45, 24.05.2010, p. 178.

Research output: Contribution to journalArticle

Zhang, X, Takeguchi, M, Hashimoto, A, Mitsuishi, K & Shimojo, M 2010, 'Improvement in depth resolution of scanning confocal electron microscopy', Default journal, vol. 45, pp. 178.
Zhang X, Takeguchi M, Hashimoto A, Mitsuishi K, Shimojo M. Improvement in depth resolution of scanning confocal electron microscopy. Default journal. 2010 May 24;45:178.
Zhang, X. ; Takeguchi, M. ; Hashimoto, A. ; Mitsuishi, K. ; Shimojo, M. / Improvement in depth resolution of scanning confocal electron microscopy. In: Default journal. 2010 ; Vol. 45. pp. 178.
@article{3c569ffc62904a20bf3212db0afbf3b9,
title = "Improvement in depth resolution of scanning confocal electron microscopy",
author = "X. Zhang and M. Takeguchi and A. Hashimoto and K. Mitsuishi and M. Shimojo",
year = "2010",
month = "5",
day = "24",
language = "English",
volume = "45",
pages = "178",
journal = "Default journal",

}

TY - JOUR

T1 - Improvement in depth resolution of scanning confocal electron microscopy

AU - Zhang, X.

AU - Takeguchi, M.

AU - Hashimoto, A.

AU - Mitsuishi, K.

AU - Shimojo, M.

PY - 2010/5/24

Y1 - 2010/5/24

M3 - Article

VL - 45

SP - 178

JO - Default journal

JF - Default journal

ER -