Improvement in depth resolution of scanning confocal electron microscopy

X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)178
JournalDefault journal
Volume45
Publication statusPublished - 2010 May 24

Cite this

Zhang, X., Takeguchi, M., Hashimoto, A., Mitsuishi, K., & Shimojo, M. (2010). Improvement in depth resolution of scanning confocal electron microscopy. Default journal, 45, 178.