| Original language | English |
|---|---|
| Pages (from-to) | 178 |
| Journal | Default journal |
| Volume | 45 |
| Publication status | Published - 2010 May 24 |
Improvement in depth resolution of scanning confocal electron microscopy
X. Zhang, M. Takeguchi, A. Hashimoto, K. Mitsuishi, M. Shimojo
Research output: Contribution to journal › Article › peer-review