Improving the lateral resolution of the MFM technique to the 10 nm range

Michael Rudolf Koblischka, U. Hartmann, T. Sulzbach

Research output: Contribution to journalArticle

32 Citations (Scopus)

Abstract

A powerful tool to investigate the magnetic properties of harddisk heads in the range of about 10 nm is demanded by magnetic data storage industry. Magnetic force microscopy (MFM) tips are prepared using the electron-beam deposition technique, which reaches the highest spatial resolution, but is not well suited for batch production. Therefore, also FIB milling is employed to produce MFM tips with a high aspect ratio similar to electron-beam deposition tips. We show that both types of tips not only improve the spatial resolution, but also considerably reduce perturbation effects on soft magnetic structures.

Original languageEnglish
Pages (from-to)2138-2140
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume272-276
Issue numberIII
DOIs
Publication statusPublished - 2004 Jan 1
Externally publishedYes

Fingerprint

Magnetic force microscopy
magnetic force microscopy
Electron beams
Magnetic storage
Magnetic structure
Aspect ratio
Magnetic properties
spatial resolution
electron beams
data storage
high aspect ratio
Industry
industries
magnetic properties
perturbation
high resolution

Keywords

  • MFM imaging
  • Preparation of tips
  • Resolution
  • Soft magnetic sample

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Improving the lateral resolution of the MFM technique to the 10 nm range. / Koblischka, Michael Rudolf; Hartmann, U.; Sulzbach, T.

In: Journal of Magnetism and Magnetic Materials, Vol. 272-276, No. III, 01.01.2004, p. 2138-2140.

Research output: Contribution to journalArticle

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