In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties

Paolo Mele, Kaname Matsumoto, Yasunori Haruyama, Masashi Mukaida, Yutaka Yoshida, Yusuke Ichino, Takanobu Kiss, Ataru Ichinose

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc 0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.

Original languageEnglish
Article number052001
JournalSuperconductor Science and Technology
Volume23
Issue number5
DOIs
Publication statusPublished - 2010 May 4
Externally publishedYes

Fingerprint

Epitaxial films
Thin films
Pulsed laser deposition
thin films
pulsed laser deposition
Film thickness
film thickness
Single crystals
single crystals
Substrates
strontium titanium oxide

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Ceramics and Composites
  • Materials Chemistry
  • Metals and Alloys

Cite this

In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties. / Mele, Paolo; Matsumoto, Kaname; Haruyama, Yasunori; Mukaida, Masashi; Yoshida, Yutaka; Ichino, Yusuke; Kiss, Takanobu; Ichinose, Ataru.

In: Superconductor Science and Technology, Vol. 23, No. 5, 052001, 04.05.2010.

Research output: Contribution to journalArticle

Mele, Paolo ; Matsumoto, Kaname ; Haruyama, Yasunori ; Mukaida, Masashi ; Yoshida, Yutaka ; Ichino, Yusuke ; Kiss, Takanobu ; Ichinose, Ataru. / In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties. In: Superconductor Science and Technology. 2010 ; Vol. 23, No. 5.
@article{1c547073619b48e7ac7e68a5165b8800,
title = "In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties",
abstract = "Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc 0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90{\%} of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.",
author = "Paolo Mele and Kaname Matsumoto and Yasunori Haruyama and Masashi Mukaida and Yutaka Yoshida and Yusuke Ichino and Takanobu Kiss and Ataru Ichinose",
year = "2010",
month = "5",
day = "4",
doi = "10.1088/0953-2048/23/5/052001",
language = "English",
volume = "23",
journal = "Superconductor Science and Technology",
issn = "0953-2048",
publisher = "IOP Publishing Ltd.",
number = "5",

}

TY - JOUR

T1 - In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties

AU - Mele, Paolo

AU - Matsumoto, Kaname

AU - Haruyama, Yasunori

AU - Mukaida, Masashi

AU - Yoshida, Yutaka

AU - Ichino, Yusuke

AU - Kiss, Takanobu

AU - Ichinose, Ataru

PY - 2010/5/4

Y1 - 2010/5/4

N2 - Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc 0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.

AB - Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc 0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.

UR - http://www.scopus.com/inward/record.url?scp=77951627912&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77951627912&partnerID=8YFLogxK

U2 - 10.1088/0953-2048/23/5/052001

DO - 10.1088/0953-2048/23/5/052001

M3 - Article

AN - SCOPUS:77951627912

VL - 23

JO - Superconductor Science and Technology

JF - Superconductor Science and Technology

SN - 0953-2048

IS - 5

M1 - 052001

ER -