In-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties

Paolo Mele, Kaname Matsumoto, Yasunori Haruyama, Masashi Mukaida, Yutaka Yoshida, Yusuke Ichino, Takanobu Kiss, Ataru Ichinose

Research output: Contribution to journalArticlepeer-review

28 Citations (Scopus)


Epitaxial Fe-Te-S thin films (thickness range 100-200nm) were deposited by pulsed laser deposition at 400 °C on SrTiO3(100) and MgO(100) single-crystal substrates. The films reached the zero-resistance condition: Tc0 = 3.54K for on SrTiO3 and 5.37K for on MgO, and presented a large upper critical field: T for on SrTiO3 and 74.2T for on MgO, using 90% of the normal state resistance and the Werthamer-Helfand-Hohenberg model. The coherence length ξ0 is very short: 2.30nm for on SrTiO3 and 2.10nm for on MgO. The film grown on MgO showed T; then the isotropic parameter γ is 1.09. The best J c observed is 104Acm-2 (at 2K, self-field) for the sample deposited on MgO.

Original languageEnglish
Article number052001
JournalSuperconductor Science and Technology
Issue number5
Publication statusPublished - 2010 May 4
Externally publishedYes

ASJC Scopus subject areas

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry


Dive into the research topics of 'In-field characterization of FeTe<sub>0.8</sub>S<sub>0.2</sub> epitaxial thin films with enhanced superconducting properties'. Together they form a unique fingerprint.

Cite this