In-situ infrared imaging methodology for measuring heterogeneous growth process of a hydride phase

H. Oguchi, Z. Tan, E. J. Heilweil, L. A. Bendersky

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

In the paper we report on a new methodology, which allows measuring in-situ heterogeneous growth rates of hydride phase in films during metal-hydride phase transformation. This optical method is based on infrared imaging of a wedge-shaped thin film during hydrogen loading. In the paper the method is demonstrated for Mg98.4Ti1.6 wedge-shaped thin film and main conclusions are supported by results of transmission electron microscopy. The methodology combined with the structural characterizations verified fast formation of MgH2 layer on top followed by drastically slower growth of the MgH2 phase. The initial averaged growth rate of the MgH2 phase was estimated as ∼1.3 nm/s, and as ∼0.03 nm/s subsequently.

Original languageEnglish
Pages (from-to)1296-1299
Number of pages4
JournalInternational Journal of Hydrogen Energy
Volume35
Issue number3
DOIs
Publication statusPublished - 2010 Feb
Externally publishedYes

Keywords

  • Heterogeneous growth
  • Hydrogen storage
  • In-situ infrared imaging
  • Thickness gradient thin film

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Fuel Technology
  • Condensed Matter Physics
  • Energy Engineering and Power Technology

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