In-situ infrared imaging methodology for measuring heterogeneous growth process of a hydride phase

H. Oguchi; Z. Tan; E. J. Heilweil; L. A. Bendersky

doi:10.1016/j.ijhydene.2009.11.037

In-situ infrared imaging methodology for measuring heterogeneous growth process of a hydride phase

H. Oguchi, Z. Tan, E. J. Heilweil, L. A. Bendersky

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

In the paper we report on a new methodology, which allows measuring in-situ heterogeneous growth rates of hydride phase in films during metal-hydride phase transformation. This optical method is based on infrared imaging of a wedge-shaped thin film during hydrogen loading. In the paper the method is demonstrated for Mg_98.4Ti_1.6 wedge-shaped thin film and main conclusions are supported by results of transmission electron microscopy. The methodology combined with the structural characterizations verified fast formation of MgH₂ layer on top followed by drastically slower growth of the MgH₂ phase. The initial averaged growth rate of the MgH₂ phase was estimated as ∼1.3 nm/s, and as ∼0.03 nm/s subsequently.

Original language	English
Pages (from-to)	1296-1299
Number of pages	4
Journal	International Journal of Hydrogen Energy
Volume	35
Issue number	3
DOIs	https://doi.org/10.1016/j.ijhydene.2009.11.037
Publication status	Published - 2010 Feb
Externally published	Yes

Keywords

Heterogeneous growth
Hydrogen storage
In-situ infrared imaging
Thickness gradient thin film

ASJC Scopus subject areas

Renewable Energy, Sustainability and the Environment
Fuel Technology
Condensed Matter Physics
Energy Engineering and Power Technology

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abstract = "In the paper we report on a new methodology, which allows measuring in-situ heterogeneous growth rates of hydride phase in films during metal-hydride phase transformation. This optical method is based on infrared imaging of a wedge-shaped thin film during hydrogen loading. In the paper the method is demonstrated for Mg98.4Ti1.6 wedge-shaped thin film and main conclusions are supported by results of transmission electron microscopy. The methodology combined with the structural characterizations verified fast formation of MgH2 layer on top followed by drastically slower growth of the MgH2 phase. The initial averaged growth rate of the MgH2 phase was estimated as ∼1.3 nm/s, and as ∼0.03 nm/s subsequently.",

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AU - Tan, Z.

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AU - Bendersky, L. A.

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