Influence of analysis parameters on the microstructural characterization of nanoscale precipitates

Ai Serizawa, M. K. Miller

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

A series of simulated microstructures containing nanometer-scale precipitates was created with an atom probe data simulator. These data were then analyzed with the proximity histogram by creating isoconcentration surfaces to determine the influence of the analysis method. For simulated 2-nm-radius spherical precipitates, the optimized voxel size and delocalization were found to be 0.5-0.6 nm and 1.0-1.5 nm, respectively. Under optimum analysis parameters, the voxelization/delocalization process only slightly degrades the interface width determined from the proximity histogram to ∼0.15±0.04 nm.

Original languageEnglish
Title of host publicationAdvanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution
Pages19-25
Number of pages7
Publication statusPublished - 2010 Dec 1
Event2009 MRS Fall Meeting - Boston, MA, United States
Duration: 2009 Nov 302009 Dec 4

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1231
ISSN (Print)0272-9172

Conference

Conference2009 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period09/11/3009/12/4

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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    Serizawa, A., & Miller, M. K. (2010). Influence of analysis parameters on the microstructural characterization of nanoscale precipitates. In Advanced Microscopy and Spectroscopy Techniques for Imaging Materials with High Spatial Resolution (pp. 19-25). (Materials Research Society Symposium Proceedings; Vol. 1231).