Instantaneous phase-stepping photoelasticity for the study of crack growth behaviour in a quenched thin glass plate

S. Yoneyama, Kenichi Sakaue, H. Kikuta, M. Takashi

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

A new approach to simultaneous acquisition of phase-stepped photoelastic fringes using a CCD camera equipped with a pixelated micro-retarder array is described for the investigation of time-variant problems. This method is applied to the study of quasi-static crack growth in a quenched thin glass plate. The distributions of the principal direction as well as the principal stress difference around a growing crack tip are obtained by the proposed method. Then, not only the mixed-mode stress intensity factors but also the T-stress are evaluated from the distribution of the principal stress difference, and they are validated using the reconstructed phase maps. The results show that the proposed instantaneous phase-stepping technique is effective for the study of the crack growth behaviour in a thin glass plate.

Original languageEnglish
Article number017
Pages (from-to)3309-3316
Number of pages8
JournalMeasurement Science and Technology
Volume17
Issue number12
DOIs
Publication statusPublished - 2006 Dec 1
Externally publishedYes

Fingerprint

photoelasticity
Photoelasticity
Crack propagation
cracks
Glass
glass
retarders
stress intensity factors
crack tips
CCD cameras
Stress intensity factors
Crack tips
acquisition

Keywords

  • Fracture
  • Instantaneous phase-stepping method
  • Micro-retarder array
  • Mixed-mode
  • Photoelasticity
  • Quasi-static crack
  • Quenched glass
  • Stress intensity factor
  • T-stress
  • Thermal stress

ASJC Scopus subject areas

  • Polymers and Plastics
  • Ceramics and Composites
  • Materials Science (miscellaneous)

Cite this

Instantaneous phase-stepping photoelasticity for the study of crack growth behaviour in a quenched thin glass plate. / Yoneyama, S.; Sakaue, Kenichi; Kikuta, H.; Takashi, M.

In: Measurement Science and Technology, Vol. 17, No. 12, 017, 01.12.2006, p. 3309-3316.

Research output: Contribution to journalArticle

@article{71724958cf844214bfe3f068ee992bb7,
title = "Instantaneous phase-stepping photoelasticity for the study of crack growth behaviour in a quenched thin glass plate",
abstract = "A new approach to simultaneous acquisition of phase-stepped photoelastic fringes using a CCD camera equipped with a pixelated micro-retarder array is described for the investigation of time-variant problems. This method is applied to the study of quasi-static crack growth in a quenched thin glass plate. The distributions of the principal direction as well as the principal stress difference around a growing crack tip are obtained by the proposed method. Then, not only the mixed-mode stress intensity factors but also the T-stress are evaluated from the distribution of the principal stress difference, and they are validated using the reconstructed phase maps. The results show that the proposed instantaneous phase-stepping technique is effective for the study of the crack growth behaviour in a thin glass plate.",
keywords = "Fracture, Instantaneous phase-stepping method, Micro-retarder array, Mixed-mode, Photoelasticity, Quasi-static crack, Quenched glass, Stress intensity factor, T-stress, Thermal stress",
author = "S. Yoneyama and Kenichi Sakaue and H. Kikuta and M. Takashi",
year = "2006",
month = "12",
day = "1",
doi = "10.1088/0957-0233/17/12/017",
language = "English",
volume = "17",
pages = "3309--3316",
journal = "Measurement Science and Technology",
issn = "0957-0233",
publisher = "IOP Publishing Ltd.",
number = "12",

}

TY - JOUR

T1 - Instantaneous phase-stepping photoelasticity for the study of crack growth behaviour in a quenched thin glass plate

AU - Yoneyama, S.

AU - Sakaue, Kenichi

AU - Kikuta, H.

AU - Takashi, M.

PY - 2006/12/1

Y1 - 2006/12/1

N2 - A new approach to simultaneous acquisition of phase-stepped photoelastic fringes using a CCD camera equipped with a pixelated micro-retarder array is described for the investigation of time-variant problems. This method is applied to the study of quasi-static crack growth in a quenched thin glass plate. The distributions of the principal direction as well as the principal stress difference around a growing crack tip are obtained by the proposed method. Then, not only the mixed-mode stress intensity factors but also the T-stress are evaluated from the distribution of the principal stress difference, and they are validated using the reconstructed phase maps. The results show that the proposed instantaneous phase-stepping technique is effective for the study of the crack growth behaviour in a thin glass plate.

AB - A new approach to simultaneous acquisition of phase-stepped photoelastic fringes using a CCD camera equipped with a pixelated micro-retarder array is described for the investigation of time-variant problems. This method is applied to the study of quasi-static crack growth in a quenched thin glass plate. The distributions of the principal direction as well as the principal stress difference around a growing crack tip are obtained by the proposed method. Then, not only the mixed-mode stress intensity factors but also the T-stress are evaluated from the distribution of the principal stress difference, and they are validated using the reconstructed phase maps. The results show that the proposed instantaneous phase-stepping technique is effective for the study of the crack growth behaviour in a thin glass plate.

KW - Fracture

KW - Instantaneous phase-stepping method

KW - Micro-retarder array

KW - Mixed-mode

KW - Photoelasticity

KW - Quasi-static crack

KW - Quenched glass

KW - Stress intensity factor

KW - T-stress

KW - Thermal stress

UR - http://www.scopus.com/inward/record.url?scp=33846097781&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33846097781&partnerID=8YFLogxK

U2 - 10.1088/0957-0233/17/12/017

DO - 10.1088/0957-0233/17/12/017

M3 - Article

VL - 17

SP - 3309

EP - 3316

JO - Measurement Science and Technology

JF - Measurement Science and Technology

SN - 0957-0233

IS - 12

M1 - 017

ER -