Investigation of hydrogen storage using combinatorial thin films and ir imaging

Hiroyuki Oguchi, Ichiro Takeuchi, Daniel Josell, Edwin J. Heilweil, Leonid A. Bendersky

Research output: Contribution to journalConference article

Abstract

Three 100 nm-thick Mg x(TM) 1.x (TM = Ni and Ti) composition spread thin films having compositional variation 0.4<x<0.95 and capped with a 5 nm-thick Pd layer were deposited in combinatorial electron-beam (e-beam) deposition chamber. Crystallinity of the films was characterized by scanning x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). Hydrogen absorption and desorption of the films were monitored with an infrared (IR) camera that could image a full area of the films. The observed changes in JR intensity due to hydrogen absorption/desorption demonstrated sensitivity of the method to the differences in compostion, microstructure and type of TM.

Original languageEnglish
Pages (from-to)1-5
Number of pages5
JournalMaterials Research Society Symposium Proceedings
Volume1042
Publication statusPublished - 2008
Externally publishedYes
EventMaterials and Technology for Hydrogen Storage - Boston, MA, United States
Duration: 2007 Nov 262007 Nov 30

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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