Investigation of melt-textured superconductors on the nanoscale

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3 Citations (Scopus)

Abstract

For the further development of the bulk, melt-processed high-Tc superconductors it is an essential issue to control the material properties on the nanoscale, as the length scale where flux pinning takes place is of the order of 10 nm. As a consequence, we need to investigate the properties of the samples accordingly on the nanoscale. Therefore, we have performed atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) scans of sample surfaces at ambient conditions which have resolved a rich variety of microstructures in the bulk samples. With the recent developments, also the (electron backscatter diffraction) EBSD technique reaches the nanometre range enabling to study the crystallographic details, especially the effect of embedded nanoparticles on the superconducting matrix. In order to obtain a direct proof of the pinning effect, the output of low-temperature STM revealing the electronic nature of the samples is studied as well. Further developments of the STM technique, e.g., employing ferromagnetic tips, may further bring informations on the flux pinning properties.

Original languageEnglish
Pages (from-to)47-52
Number of pages6
JournalMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume151
Issue number1
DOIs
Publication statusPublished - 2008 Jun 15
Externally publishedYes

Fingerprint

Scanning tunneling microscopy
Superconducting materials
Flux pinning
scanning tunneling microscopy
flux pinning
Electron diffraction
Atomic force microscopy
Materials properties
Nanoparticles
Microstructure
atomic force microscopy
nanoparticles
microstructure
output
matrices
electronics
diffraction
Temperature
electrons

Keywords

  • EBSD
  • Melt-textured superconductors
  • Nanostructure
  • SPM

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

@article{4114c3ea084e418e9b54ad34851496e3,
title = "Investigation of melt-textured superconductors on the nanoscale",
abstract = "For the further development of the bulk, melt-processed high-Tc superconductors it is an essential issue to control the material properties on the nanoscale, as the length scale where flux pinning takes place is of the order of 10 nm. As a consequence, we need to investigate the properties of the samples accordingly on the nanoscale. Therefore, we have performed atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) scans of sample surfaces at ambient conditions which have resolved a rich variety of microstructures in the bulk samples. With the recent developments, also the (electron backscatter diffraction) EBSD technique reaches the nanometre range enabling to study the crystallographic details, especially the effect of embedded nanoparticles on the superconducting matrix. In order to obtain a direct proof of the pinning effect, the output of low-temperature STM revealing the electronic nature of the samples is studied as well. Further developments of the STM technique, e.g., employing ferromagnetic tips, may further bring informations on the flux pinning properties.",
keywords = "EBSD, Melt-textured superconductors, Nanostructure, SPM",
author = "Koblischka, {Michael Rudolf} and Koblischka-Veneva, {Anjela Dimitrova}",
year = "2008",
month = "6",
day = "15",
doi = "10.1016/j.mseb.2008.02.011",
language = "English",
volume = "151",
pages = "47--52",
journal = "Materials Science and Engineering B: Solid-State Materials for Advanced Technology",
issn = "0921-5107",
publisher = "Elsevier BV",
number = "1",

}

TY - JOUR

T1 - Investigation of melt-textured superconductors on the nanoscale

AU - Koblischka, Michael Rudolf

AU - Koblischka-Veneva, Anjela Dimitrova

PY - 2008/6/15

Y1 - 2008/6/15

N2 - For the further development of the bulk, melt-processed high-Tc superconductors it is an essential issue to control the material properties on the nanoscale, as the length scale where flux pinning takes place is of the order of 10 nm. As a consequence, we need to investigate the properties of the samples accordingly on the nanoscale. Therefore, we have performed atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) scans of sample surfaces at ambient conditions which have resolved a rich variety of microstructures in the bulk samples. With the recent developments, also the (electron backscatter diffraction) EBSD technique reaches the nanometre range enabling to study the crystallographic details, especially the effect of embedded nanoparticles on the superconducting matrix. In order to obtain a direct proof of the pinning effect, the output of low-temperature STM revealing the electronic nature of the samples is studied as well. Further developments of the STM technique, e.g., employing ferromagnetic tips, may further bring informations on the flux pinning properties.

AB - For the further development of the bulk, melt-processed high-Tc superconductors it is an essential issue to control the material properties on the nanoscale, as the length scale where flux pinning takes place is of the order of 10 nm. As a consequence, we need to investigate the properties of the samples accordingly on the nanoscale. Therefore, we have performed atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) scans of sample surfaces at ambient conditions which have resolved a rich variety of microstructures in the bulk samples. With the recent developments, also the (electron backscatter diffraction) EBSD technique reaches the nanometre range enabling to study the crystallographic details, especially the effect of embedded nanoparticles on the superconducting matrix. In order to obtain a direct proof of the pinning effect, the output of low-temperature STM revealing the electronic nature of the samples is studied as well. Further developments of the STM technique, e.g., employing ferromagnetic tips, may further bring informations on the flux pinning properties.

KW - EBSD

KW - Melt-textured superconductors

KW - Nanostructure

KW - SPM

UR - http://www.scopus.com/inward/record.url?scp=47649132300&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=47649132300&partnerID=8YFLogxK

U2 - 10.1016/j.mseb.2008.02.011

DO - 10.1016/j.mseb.2008.02.011

M3 - Article

AN - SCOPUS:47649132300

VL - 151

SP - 47

EP - 52

JO - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

JF - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

SN - 0921-5107

IS - 1

ER -