Investigation on grown-in defects in CZ-Si crystal under slow pulling rate

Jun Furukawa, Hideo Tanaka, Yuji Nakada, Naoki Ono, Hiroyuki Shiraki

Research output: Contribution to journalConference articlepeer-review

15 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Investigation on grown-in defects in CZ-Si crystal under slow pulling rate'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds

Physics & Astronomy