Original language | English |
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Pages (from-to) | 809-811 |
Journal | Default journal |
Volume | 73 |
Publication status | Published - 1998 Aug 1 |
Investigations of SiO2/n-GaN and Si3N4/n-GaN insulator-semiconductor interfaces with low interface state density
S. Arulkumaran, T. Egawa, H. Ishikawa, T. Jimbo, M. Umeno
Research output: Contribution to journal › Article › peer-review
193
Citations
(Scopus)